Silicon Motion, Inc.

Macronix International Co., Ltd.

Coretronic Corporation

Viking Technology Corporation

Chun-Chieh Chen

Lung-Hsin Chen

Wei-Ming Chen

Ming-Chih Kao

Lien-Che Ho

Kun-Yu Liu

Wen-Chin Chen

A method for controlling a storage device is provided. The method may include: transmitting an initial command conforming to a first communications protocol and a data payload comprising a command parameter to the storage device, wherein the command parameter conforms to a second communications protocol; transmitting a setting command conforming to the first communications protocol to the storage device; and generating an operation command conforming to the second communications protocol according to the initial command, the setting command and the data payload comprising the command parameter. More particularly, the initial command and the setting command are different commands.

Method for controlling storage device

A method for controlling a storage device is provided. The method may include: transmitting an initial command conforming to a first communications protocol and a data payload including a command parameter conforming to a second communications protocol to the storage device; transmitting a setting command conforming to the first communications protocol to the storage device; transmitting a confirmation command conforming to the first communications protocol to the storage device; and according to a data payload corresponding to the confirmation command, confirming whether the initial command, the setting command, and the confirmation command are successfully executed.

An interface apparatus and a method of writing an extended display identification data (EDID) are provided. The interface apparatus includes a data processing unit, a memory unit and a switching unit. The memory unit is coupled to a connector corresponding to the memory unit and the data processing unit via the switching unit. When the interface apparatus is being initialized, the data processing unit detects whether or not the EDID stored in the memory unit is correct. If the EDID stored in the memory unit is incorrect, the data processing unit rewrites the EDID to the memory unit.

Interface apparatus and method of writing extended display identification data

The present invention provides a method of producing an added defect count for monitoring the property of chambers or wafers. First, a proper pre-process sensitivity is determined with map to map process by maximizing the summation of a mapping rate and a catching rate. Second, a wafer is scanned with the proper pre-process sensitivity and a pre-process particle number P is recorded. Third, a manufacturing step is processed on the wafer. Fourth, the wafer is scanned with the most sensitive scale of the post-process sensitivities and a post-process particle number P is recorded. Finally, the post-process particle number P is subtracted from the pre-process particle number P .

Method of calculating the real added defect counts

The present invention relates to a fabrication method for integrated passive component, comprising the steps of providing an insulator substrate and then planarizing the insulator substrate; forming integrated passive components on the insulator substrate; and packaging the integrated passive components by a thick film packaging method. The advantages of the method of the invention are that the fabricated components are miniaturized, the yield is high, and cost of production is low.

Growing community of inventors

Hsinchu, Taiwan

Chun-Chieh Chen