Samsung Electronics Co., Ltd.

Chulhwan Choo

Doohee Hwang

Jeongseok Seo

Yunkyeong Jeong

A method of operating a memory device, the method includes periodically receiving a refresh command from a host, determining whether a target row address is activated during a predetermined period of time, and skipping a refresh operation on a word line corresponding to the target row address when the target row address is activated, and transmitting, to the host, a refresh skip signal corresponding to the word line on which the refresh operation is skipped, or performing, in response to the refresh command, a refresh operation on a word line corresponding to the target row address when the target row address is not activated.

Memory device, memory system including memory device, and method of operating memory device

The present disclosure relates to a semiconductor memory device. The semiconductor memory device includes memory cell array, error correction code (ECC) engine, refresh control circuit and control logic circuit. The memory cell array includes memory cell rows. The refresh control circuit performs a refresh operation on the memory cell rows. The control logic circuit controls the ECC engine such that the ECC engine generates an error generation signal by performing ECC decoding on sub-pages in at least one first memory cell row during a read operation. The control logic circuit compares an error occurrence count of the first memory cell row with a threshold value and provides the refresh control circuit with a first address of the first memory cell row as an error address based on the comparison. The refresh control circuit increases a number of refresh operations performed in the first memory cell row during a refresh period.

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Hwaseong-si, South Korea

Chulhwan Choo