Skhynix Inc.

Hynix Semiconductor Inc.

Chul Woo Yang

Mi Sun Yoon

Sang Oh Lim

Byoung Kwan Jeong

Tai Kyu Kang

Yi Seul Park

A memory device, including a plurality of planes, includes a mode setting component to set an operation mode of the memory device as a verify pass mode to allow a verify operation, performed in the plurality of planes, to forcibly pass; and a verify signal generator for outputting a verify pass signal signaling that the verify operation has passed for each of the plurality of planes.

Memory device for passing verify operation and operating method of the same

A page buffer includes a bit line sensing circuit, a latch, and a main latch for sensing and storing data from a memory cell. The bit line sensing circuit is coupled with the memory cell by a bit line and configured to perform a bit line sensing operation of sensing first data stored in the memory cell. The latch control circuit is coupled with the bit line sensing circuit. The main latch is coupled with the bit line sensing circuit through the latch control circuit and configured to perform a main latch operation of storing the sensed first data. The cache latch is coupled with the main latch and configured to perform a cache latch operation of storing second data stored in the main latch. Wherein a period of time of the cache latch operation overlaps with a period of time of the bit line sensing operation.

Memory device and method of operating the memory device

A semiconductor device includes a memory block including memory cells for storing program data and one or more flag cells for storing erase state information, an operation circuit suitable for performing a program operation, an erase operation, and a read operation on the memory cells and the flag cell, and a data conversion circuit suitable for encoding read data read from the memory cells based on the erase state information.

Semiconductor device

A nonvolatile memory apparatus includes: a memory cell area including a plurality of memory cells connected to a word line and a bit line; a program time controller configured to determine a program voltage application time for a selected word line, as the selected word line is selected in response to a program command and an address signal; and a controller configured to apply a program voltage to the selected word line according to the program voltage application time determined by the program time controller.

Nonvolatile memory apparatus capable of determining an application time of a program voltage applied to a selected word line

A method of operating a nonvolatile memory device comprises reading erase number information which is updated and stored whenever erasure is performed, setting program start voltages and step voltages based on the erase number information, and performing a program operation based on the program start voltages and the step voltages.

Method of operating nonvolatile memory device

A data erasing method of a semiconductor memory apparatus may include: if any one threshold voltage of a plurality of memory cells, for which an erase operation has been performed using an erase voltage pulse, is higher than an erase verification voltage, increasing a voltage level of the erase verification voltage applied to a plurality of word lines of the plurality of memory cells until the threshold voltage of the plurality of memory cells is lower than the erase verification voltage, and increasing a voltage level of the erase voltage pulse by an increased voltage level of the erase verification voltage and applying the erase voltage pulse to the plurality of memory cells.

Semiconductor memory apparatus and data erasing method

A counting circuit includes first to fifth flip-flops (FFs) and a logic operation unit. Each of the first to fourth FFs has an initial value based on a preset control signal input through a 4-bit set terminal. Each of the first to fourth FFs receives a signal at a corresponding input terminal. And each of the first to fourth FFs outputs a signal at a corresponding output terminal according to a clock signal. The fifth FF is coupled to the output terminal of the fourth FF and is configured to output the output signal of the fourth FF synchronously with the clock signal. The logic operation unit logically combines the output signals of the second to fourth FFs and outputs first and second counting signals.

Counting circuit and address counter using the same

A method of programming a nonvolatile memory device includes an inputting step for inputting program data to a first latch of each of page buffers, and inputting redundancy data to a second latch of each of the page buffers, a verification result storage step for performing a program operation on selected memory cells using the program data stored in the first latch, performing a verification operation for the program operation, and storing a result of the verification operation in the first latch of each of the page buffers coupled with the selected memory cells, a verification result change step for changing the result stored in the first latch using the redundancy data stored in the second latch, and a verification check step for determining whether all data stored in the second latches, after the verification result change step, are program pass data.

Method of programming nonvolatile memory device

A counting circuit includes first to fifth flip-flops (FFs) and a logic operation unit. Each of the first to fourth FFs has an initial value based on a preset control signal input through a 4-bit set terminal and outputs a signal according to a clock signal. The fifth FF is coupled to the output terminal of the fourth FF and is configured to output the output signal of the fourth FF synchronously with the clock signal. The logic operation unit logically combines the output signals of the second to fourth FFs and outputs first and second counting signals.

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Gyeonggi-do, South Korea

Chul Woo Yang