Boe Technology Group Co., Ltd.

Hefei Xinsheng Optoelectronics Technology Co., Ltd.

Chuanbing Wei

Song Wu

Lin Zhang

Xiaoming Zhang

Huapeng Sheng

Linshan Tian

A probe assembly and a detecting device including the same, the probe assembly is configured to detect the display panel and includes a first probe region corresponding to leads of the display panel, wherein a location in the first probe region corresponding to a first lead among the leads connected in the display panel is provided with a probe, and a location in the first probe region corresponding to a lead adjacent to the first lead is not provided with a probe; wherein the first lead is any one of the leads which are connected. The detecting device comprises the probe assembly. It solves the problem that the currently known probe assembly may result in short-circuit between adjacent probes when used for display panel detection, avoids the condition where a detective display panel cannot be detected, improves the detection rate, ensures the image quality of the display panel, and hence avoids a waste of production material and reduces the production cost.

Probe assembly and detecting device comprising the same

The present invention provides a detecting apparatus and a detecting method. The detecting apparatus comprises: a base, a light source module, an image generating unit and a detecting unit. The light source module is configured to generate detecting light and cause the detecting light to irradiate towards the image generating unit after passing through an area of a shorting bar circuit in a panel. The image generating unit is configured to receive the detecting light irradiating thereon, and generate a detecting image of the area of the shorting bar circuit. The detecting unit is configured to detect whether the shorting bar circuit in the panel is cut off based on the detecting image. As the detecting light passing through the panel lasts for a longer time and is of higher brightness, the detecting image generated by the image generating unit is clearer.

Detecting apparatus and detecting method

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Beijing, China

Chuanbing Wei