Texas Instruments Corporation

Chu-Ping Wang

Ashwin H Shah

Richard H Womack

A scheme for addressing memory cells in random access memory arrays includes bit lines divided into a plurality of segments. Each pair of bit lines has a sense amp at each end coupled to both bit lines in the pair. Word lines address memory cells coupled to each bit line of the pair. When a pair of memory cells is accessed, the bit lines are electrically divided so that one memory cell is coupled to one sense amp through one bit line, and the other memory cell is coupled to the other sense amp through the other bit line. The memory cells can be coupled to the bit lines through segment lines, with each segment line connecting a subset of the memory cells to a bit line, in order to reduce capacitances presented to the sense amps. An alternating linear array of sense amps and bit line pairs can be used to increase overall density of the memory array by allowing sense amps to access more than one bit line pair. The bit lines are addressed so that each sense amp receives data from one one bit line pair at a time. Segment lines having no currently addressed memory cells can be coupled to the sense amps in order to better balance input capacitances presented thereto. Selecting the bit line sections, segments, and memory cells in the proper order minimizes the effect of noise due to stray capacitances by causing them to appear as a common mode signal across the bit line pairs.

Dual ended folded bit line arrangement and addressing scheme

A semiconductor memory includes a memory array (10) that is operable to be addressed in either the page mode or the static column decode mode. A column address transparent latch (20) is provided which is controlled to either directly input a column address to a column decoder (26) or to latch the address in response to the generation of the column address strobe. A sequence detect circuit (30) detects the sequence to the row address strobe and the column address strobe to determine whether the page mode or the static column decode mode is generated. The sequence detect circuit (30) generates a Y-enable signal in a circuit (31) for control of the latch (20).

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Carrollton, TX, United States of America

Chu-Ping Wang