Micron Technology Incorporated

Western Digital Technologies, Inc.

Christopher Scott Moore

Joseph A De La Cerda

Bruce J Ford

Ezra E Hartz

Nicolas Soberanes

Benjamin Rivera

Yacov Duzly

Elad Baram

Karin Alicia Werder

A processing device coupled to the memory device can be configured to monitor respective raw bit error rates (RBERs) corresponding to a plurality of groups of memory cells of the memory device. The processing device can also be configured to responsive to determining that an RBER corresponding to a particular group of the plurality of groups of memory cells has met a criteria, adjust a read window budget corresponding to the particular group of memory cells.

Raw bit error rate based trim level adjustments for memory

An apparatus can include an array of memory cells and control circuitry coupled to the array of memory cells. The control circuitry can be configured to store a number of trim settings and receive signaling indicative of a use of the array of memory cells. The control circuitry can be configured to determine an adjustment to the number of trim settings based at least in part on the signaling.

Adjustment to trim settings based on a use of a memory device

A method includes determining a quantity of refresh operations performed on a block of a memory device of a memory sub-system and determining a quantity of write operations and a quantity of read operations performed to the block. The method also includes determining the block is read dominant using the quantity of write operations and the quantity of read operations and determining whether the quantity of refresh operations has met a criteria. The method further includes, responsive to determining that the block is read dominant and that the quantity of refresh operations has met the criteria, modifying trim settings used to operate the block of the memory device.

Trim level adjustments for memory based on data use

A data retention operation is performed in a non-volatile memory in response to detection of a triggering event. The data retention operation includes updating a value of a write parameter of the non-volatile memory and storing into the non-volatile memory at least one copy of contents of a boot portion of the non-volatile memory using the updated value of the write parameter. The updated value of the write parameter increases retention of stored data during extended periods of inactivity at the non-volatile memory.

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Christopher Scott Moore