Skhynix Inc.

Sk Hynix Memory Solutions Inc.

Christopher S Tsang

Frederick K H Lee

Jason Bellorado

Naveen Kumar

Lingqi Zeng

Zheng Wu

Xiangyu Tang

A bit flip count is determined for each bin in a plurality of bins, including by: (1) performing a first read on a group of solid state storage cells at a first threshold that corresponds to a lower bound for a given bin and (2) performing a second read on the group of solid state storage cells at a second threshold that corresponds to an upper bound for the given bin. A minimum is determined using the bit flip counts corresponding to the plurality of bins and the minimum is used to estimate an optimal threshold.

Threshold estimation using bit flip counts and minimums

An optimal read threshold estimation method includes determining a flip difference corresponding to an optimal step size &#x394;, estimating a first slope mat a first read point and a second slope mat a second read point, and obtaining an optimal read threshold (X) as the intersection of a first line with the first slope mand a second line with the second slope m.

Optimal read threshold estimation

Growing community of inventors

Santa Clara, CA, United States of America

Christopher S Tsang