National Instruments Corporation

Christopher N White

Gerardo Orozco Valdes

Thomas Deckert

Johannes D H Lange

Karl F Grosz

Stephen L Dark

Johannes DH Lange

Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.

Hardware timed over-the-air antenna characterization

Correlation of device-under-test orientations and radio frequency measurements

Methods and systems are disclosed for using a single receiving device, such as a single VSA, to capture and digitize multiple time-domain acquisitions of a repeating signal at different center frequencies, to create a single time-domain waveform having a bandwidth greater than the real-time instantaneous bandwidth of the receiving device. Specifically, one or more signal processing paths may process the multiple digitized acquisitions of the repeating signal, either sequentially or in parallel, such that the processed acquisitions may be aggregated into a representation of one or more repetitions of the repeating signal.

Time sequenced spectral stitching

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Cedar Park, TX, United States of America

Christopher N White