Siemens Industry Software Gmbh

Christopher Münch

Jongsin Yun

Mehdi Baradaran Tahoori

An address-skipping trim search performed by a memory built-in self-test system comprises: perform memory read operations on one memory bank to determine whether it fails to correctly sense values of stored data based on a reference trim value for a previous memory bank; if the present memory bank fails, perform memory read operations to search for a new reference trim value for the present memory bank; or otherwise, treat the present reference trim value as the one for the present memory bank and proceed to testing a next memory bank. The range for searching for the new reference trim value can be limited by the present reference trim value.

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Karlsruhe, Germany

Christopher Münch