The United States of America As Represented by the Department of Energy

Christopher M Condon

Mahendra P Mathur

James L Spenik

Daniel J Driscoll

Esmail R Monazam

Rodney Anderson

William L Fincham, Jr

The disclosure relates to analysis of materials using a capacitive sensor to detect anomalies through comparison of measured capacitances. The capacitive sensor is used in conjunction with a capacitance measurement device, a location device, and a processor in order to generate a capacitance versus location output which may be inspected for the detection and localization of anomalies within the material under test. The components may be carried as payload on an inspection vehicle which may traverse through a pipe interior, allowing evaluation of nonmetallic or plastic pipes when the piping exterior is not accessible. In an embodiment, supporting components are solid-state devices powered by a low voltage on-board power supply, providing for use in environments where voltage levels may be restricted.

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Morgantown, WV, United States of America

Christopher M Condon