Keysight Technologies, Inc.

Avago Technologies Fiber IP (singapore) Pte. Ltd

Agilent Technologies, Inc.

Lumileds Lighting U.s., LLC

Christopher L Coleman

Gregory Steven Lee

Ye Chen

Gregory Douglas VanWiggeren

Bogdan Szafraniec

Tak Kai Wang

Paul Lewis Corredoura

Laurence Ray McColloch

Robert E Wilson

James A Matthews

Tak Kui Wang

Ronald T Kaneshiro

Brenton Arthur Baugh

Kendra J Gallup

Tanya Jergeris Snyder

James Joseph Dudley

James Howard Williams

Myunghee Lee

Kit M Cham

Stefano G Therisod

Dietrich W Vook

Craig T Cummings

Thomas S Low

Ryan Scott

Chan Fong Tan

Gregory W Eng

Yu-Chun Chang

Robert H Weissman

Mong Long Ang

Andrew Engel

A system is provided for emulating return optical pulses from at least one emulated target in response to a time of flight (TOF) lidar signal. The system includes an optical blocker configured to partially reflect or guide emitted optical pulses emitted by a TOF lidar sensor; a detector configured to detect the partially reflected or guided optical pulses, and to output corresponding electrical pulses; an electrical delay circuit configured to delay the electrical pulses to indicate distance to the at least one emulated target relative to the TOF lidar sensor; at least one laser configured to reemit return optical pulses in response to the delayed electrical pulses; a collimator configured to collimate the return optical pulses; and a diffuser configured to diffuse the collimated return optical pulses over a predetermined range of azimuthal angles toward the TOF lidar sensor.

System and method for emulating echo signals for lidar sensor

Systems and components for testing a light detection and ranging (LIDAR) device under test (DUT) are described. In one example, an ellipsoid is adapted to receive the LIDAR DUT at a first focal point, where light transmitted from the LIDAR DUT is incident on the second focal point. In another example a plurality of optical waveguides arranged in at least a portion of a circle, and the plurality of optical waveguides are adapted to receive light from the LIDAR DUT. In another example, a LIDAR distance simulator is adapted to receive an optical input, and includes optical switches that are selectively connected to one of a plurality of optical delay devices to an input of the one of a plurality of optical input channels. Illustrative delay elements may be realized through optical delay elements or a combination of optical and electrical delay elements.

Lidar test systems

A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE) disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

System for determining optical probe location relative to a photonic integrated circuit

Various illustrative embodiments disclosed herein generally pertain to detecting defects by using a radio-frequency debugging signal transmitted by a transmitting antenna array towards a receiving antenna located in a far-field region of the transmitting antenna array. The radio-frequency debugging signal, which is configured to provide information pertaining to a signal radiation distribution of the transmitting antenna array, is received in the receiving antenna and conveyed to a test unit. The test unit digitizes the received radio-frequency debugging signal to obtain a digital dataset and applies a back-propagation algorithm to the digital dataset for deriving a reconstructed near-field representation of the transmitting array. The reconstructed near-field representation is compared to a signal radiation reference template in order to detect a defective amplitude and/or a defective phase that is indicative of a defect in the transmitting antenna array and/or a device-under-test coupled to the transmitting antenna array.

Systems and methods for detecting defects in an antenna array and/or in a device coupled to the antenna array

An optical modulator that is adapted to modulate a light signal at very high RF frequencies and provide the modulating RF signal to equipment separate from the modulator is disclosed. The modulator includes a Mach-Zehnder Modulator in which light loses due to the crossing of the RF waveguide conductors and the optical waveguides are reduced. In addition, problems arising from asynchrony between the RF signals and the optical signals are reduced. The modulator also reduces signal losses due to resonances in the modulator. The modulator can be configured to be used in test probes that require a compact configuration that is adapted to designs having multiple test probes that are proximate to each other.

High-frequency light modulator

A test system for testing a DUT includes a first array of probe elements located in the near field of the DUT antenna that is either mechanically translated or electrically scanned in a first direction while being electrically scanned in a second direction that is different from the first direction to sense a bounded radiation surface comprising RF signals transmitted by the DUT antenna. A test system receiver receives first near field values contained in the RF signals and inputs them to processing logic of the test system. A reference measurement apparatus of the test system detects the RF signals and obtains reference information therefrom. Processing logic of the test system uses the reference information to correct near field phase values contained in or derived from the first near field values for phase shift between the local oscillator (LO) of the DUT and the LO of the test system.

System and method for performing over-the-air (OTA) testing of a device under test (DUT) having an integrated transmitter-antenna assembly

A method determines far field EVM of a DUT using over-the-air (OTA) testing, the DUT having a transmitter/receiver and an antenna that are integrated together such that there is no connection port for interfacing a test system for directly measuring the EVM. Modulated RF signals transmitted by the DUT propagate OTA via the antenna. The method includes performing a near field scan of a bounded radiation surface, which includes measurement points at which waveforms of a repeatedly transmitted modulated RF signal are measured; downconverting the waveforms to intermediate frequency (IF), and digitizing the IF waveforms; synthesizing digital waveforms corresponding to the IF waveforms; accounting for corresponding RF propagation in the far field for the digital waveforms; providing a modulated digital IF waveform using the digital waveforms for which RF propagation has been accounted; and calculating EVM of the DUT in the far field using the modulated digital IF waveform.

Determining far field error vector magnitude (EVM) of a device under test over the air (OTA)

A test system for testing a DUT includes near field and intermediate field measurement devices located in a near field and an intermediate field, respectively, of the DUT antenna that sample first and second bounded radiation surfaces, respectively, comprising RF signals emitted by the DUT antenna in at least first and second directions in which the bounded radiation surfaces extend. A receiver of the test system generates first and second matrices of near field and intermediate field values, respectively, from the samples obtained by the near field and intermediate field measurement devices, respectively and inputs them to processing logic of the test system. The processing logic processes the first and second matrices of near field and intermediate field values, respectively, and derives a third matrix of near field phase values therefrom.

System and method for performing over-the-air (OTA) testing of a device under test (DUT) having an integrated transmitter-antenna assembly using near field and intermediate field measurements

A tunable laser comprises a first tuner configured to select an emission wavelength of the laser; a second tuner configured to adjust a cavity mode of the laser by modifying the cavity optical path length. The second tuner is constrained by a finite tuning range. The tunable laser also comprises a controller configured to control the first and second tuners to select the emission wavelength and adjust the cavity mode in synchronization to perform phase-continuous tuning across a range larger than supported by the finite tuning range of the second tuner.

Phase-continuous tunable laser

A reflector for use in an optical transceiver module and methods for making and using the reflector are provided. The methods for making the reflector reduce the amount of processing and handling of the wafer that are required, thereby reducing manufacturing costs and increasing yield. The reflector may have a diffraction-inducing structure formed thereon such that light received from the light source is redirected in a plurality of directions, including toward a lens that couples light into an end of a transmit fiber and in at least one other direction for being sensed by a detector that converts the detected light into electrical energy.

Optical transceiver module having a front facet reflector and methods for making and using a front facet reflector

Disclosed are various embodiments of systems, devices and methods for forming an hermetic seal between a lid and a submount for an electronics module or package. At least one thieving pad is connected to a metallized ring formed about or near the circumference of an upper surface of the submount. A corresponding metallized ring is disposed about the lower perimeter of the lid. Solder paste is placed between the two metallized rings and melted, preferably under a reducing atmosphere. Excess molten solder controllably flows towards the at least one thieving pattern while the lid is being hermetically sealed and soldered, avoiding the formation of undesired wayward solder balls inside the package.

Systems, devices, components and methods for hermetically sealing electronic modules and packages

An optoelectronic package or sub-assembly includes an edge-emitting laser and a reflector that directs a beam from the laser through a sub-mount. The sub-mount contains passive or active circuit elements that are electrically connected to the laser. The laser can be protected from the environment using either a cap in which the reflector is integrated or using an encapsulant encasing the laser. An alignment post that is sized to fit into a sleeve is mounted where the optical signal emerges from the sub-mount. Plugging the post into one end of the sleeve and inserting an optical fiber into the other end of the sleeve so that the optical fiber abuts the post will then align the optical fiber to receive the optical signal.

Optical device package with turning mirror and alignment post

Disclosed are various embodiments of systems, devices, components and methods for launching high-transmission-rate optical communication signals into legacy fiber optic cables. At least one aperture is provided on a proximal end of single-mode fiber optic stub so as to block or otherwise control the propagation of unwanted light into and through the stub. In one embodiment, a low-cost spheroidal lens is mounted between the optical transmitter and the proximal end of the fiber optic stub to focus and direct light emitted by the optical transmitter towards the fiber optic stub. The relatively broad light beam formed by the low-cost lens, in combination with the aperture, removes the requirement to precisely align the transmitter, lens and stub with one another, and further does away with the conventional requirement to attenuate the amount of signal power provided to the fiber optic stub.

Apertured fiber optic stub for control of multi-mode launch condition

Compactness is preserved while enabling beam monitoring of optical properties of an output beam by employing a combination of reflection and diffraction. An input beam is reflected, divided using reflection/diffraction, and re-reflected. As a consequence, both a light source and one or more beam monitoring detectors may be disposed along a single side of an optical module. In one embodiment, an input beam is introduced from a first side of an optical module, is reflected by a 45 degree mirror, and is divided by a diffraction grating which redirects a minor portion of the beam energy back to the 45 degree mirror. Following the second reflection from the mirror, the returned portion of the beam is used to measure one or more optical properties.

Compact laser output monitoring using reflection and diffraction

An optical coupler converts a light distribution from a light source into a small angle distribution that extends over a volume larger than the variations in the alignment of an optical fiber. In one embodiment, a diffractive or hybrid diffractive/refractive bifocal lens forms first and second images of the light source respectively in first and second image planes. An input face of the optical fiber is between the first and second image planes and receives light diverging from the first image plane and light converging toward the second image plane. The net optical power coupling into the fiber is uniform over a large range of fiber positions and provides the optical coupler with a relaxed tolerance for misalignment of the fiber or the light source. The relaxed alignment tolerance facilitates low cost manufacture of multi-channel optical transmitters using single-mode optical fibers.

Growing community of inventors

San Jose, CA, United States of America

Christopher L Coleman