Other

Atmel Corporation

Qinetiq Limited

Christopher John Hill

Omar Kebichi

Wu-Tung Cheng

Paul J Reuter

Samuel Daniel Brunet

Vivek Pant

Grahame K Reynolds

Yahya M Z Mustafa

Andrew Fuller

Andrew Charles Lewin

Thomas Hans Rinderknecht

Michael Harris

Ian Alexander Burgess

In one embodiment, a method includes receiving a request to refresh a display for a refresh period, wherein the display is coupled to a touch sensor operable to detect touch input at the display. During a first phase of the refresh period, a first portion of the display is refreshed while the touch sensor a second portion and a third portion of the display is activated. The second portion and the third portion are a half screen distance apart. During a second phase of the refresh period, the second portion of the display is refreshed while the touch sensor at a fourth portion and a fifth portion of the display is activated. The fourth portion and the fifth portion are a half screen distance apart.

Simultaneous touch sensor scanning and display refreshing for display-embedded touch sensors

In one embodiment, a method includes receiving a request to refresh a display for a refresh period, wherein the display is coupled to a touch sensor operable to detect touch input at the display. The method also includes refreshing a first portion of the display and activating the touch sensor at a second portion of the display different from the first portion of the display during a first portion of the refresh period. The method further includes, during a second portion of the refresh period, refreshing a third portion of the display different from the first and second portions of the display and activating the touch sensor at a fourth portion of the display different from the first, second, and third portions of the display.

Simultaneous touch sensor scanning and display refreshing for minimizing display degradation for display-embedded touch sensors

A bistatic laser radar (lidar) device is described that comprises a transmit channel () for forming a focused transmit beam, and a receive channel () for forming a focused receive beam. The device is arranged such that the focus of the transmit beam and the focus of the receive beam fall on a common axis when focused to a distance within the operable distance range of the device. The device may be used for vibrometry, wind speed measurements and the like. Implementation of such a device using optical fiber based components is described.

Bistatic laser radar apparatus

A test circuit is disclosed for testing embedded synchronous memories. A BIST controller is used to address the memory and provide reference data that is compared to the memory output. Pipeline registers are used to allow the BIST controller to perform reads and/or writes during every clock cycle. In one aspect, the BIST controller includes a reference data circuit that stores or generates data for comparison to the memory output. A pipeline register is positioned before the reference data circuit or between the reference data circuit and compare circuitry. Additional pipeline registers may be positioned between a compare capture circuit and the compare circuitry. The pipeline registers free the BIST controller from having to wait for a read to complete before starting the next read or write. To reduce the number of pipeline registers needed, a negative-edge BIST controller can be used with a positive-edge memory or vice versa.

Full-speed BIST controller for testing embedded synchronous memories

A method and apparatus for testing an integrated circuit using built-in self-test (BIST) techniques is described. In one aspect, a BIST circuit comprises a scan monitor with hold logic and a signature generation element. The hold logic is operable to suspend signature generation in the signature generation element at any desired point in the test sequence. In some embodiments, the hold logic comprises a scan-loadable signature hold flip-flop which allows the logic BIST controller to be restarted from any selected pattern within a pattern range and to run to any subsequent pattern. The BIST session can be run incrementally, testing and reporting intermediate MISR signatures. External automatic testing equipment can suspend signature generation at selected times during a BIST session to prevent tainting of the signature generation element. The hold logic also may comprise a rotating hold ring to suspend signature generation during predetermined shift cycles.

Restartable logic BIST controller

A circuit is disclosed for testing memories using multiple built-in self test (BIST) controllers embedded in an integrated circuit (IC). The BIST controllers are brought to a synchronization point during the memory test by allowing for a synchronization state. An output signal from an output pin on the IC indicates the existence of a synchronization state to automated test equipment (ATE). After an ATE receives the output signal, it issues a resume signal through an IC input pin that causes the controllers to advance out of the synchronization state. The ATE controls the synchronization state length by delaying the resume signal. Synchronization states can be used in parametric test algorithms, such as for retention and IDDQ tests. Synchronization states can be incorporated into user-defined algorithms by software design tools that generate an HDL description of a BIST controller operable to apply the algorithm with the synchronization state.

Synchronization point across different memory BIST controllers

A method performed by a software design tool for providing an algorithm to a BIST controller that tests memory within a circuit. The method includes reading a description of a user defined test algorithm for a BIST controller, translating the description into an in-memory representation of the user defined algorithm, and reading a memory model selected by a user. The in-memory representation of the user-defined algorithm is associated with the selected memory model. From the association an HDL description of a BIST controller is generated. The HDL description is operable to apply the user defined algorithm to a memory corresponding to the selected memory model.

Growing community of inventors

Hampshire, United Kingdom

Christopher John Hill