Graftek Imaging Inc.

Frito-lay North America, Inc.

Christopher Jan Koci

Romik Chatterjee

Robert Eastlund

Archer Forrest Finley

Sean Eichenlaub

Vincent Ip

Clark A Turpin

Evan N Sanford

Thomas M Sterritt

Sih Ying Wu

Keith Chan

Nicholas Conrad

Devices, systems, and methods for real-time peeling are disclosed. Peeling can include including evaluating and controlling one or more peelers to remove peel from organic materials. Evaluation can be performed by an evaluation system including a convolutional neural network to determine a peel value. Control can be performed by a machine learning model on the basis of the peel value. Control can include determination of real-time settings for peeler tool speed and/or gate position.

Devices, systems, and methods for real-time peeling

Vision systems for robotic assemblies for handling cargo, for example, unloading cargo from a trailer, can determine the position of cargo based on shading topography. Shading topography imaging can be performed by using light sources arranged at different positions relative to the image capture device(s).

Shading topography imaging for robotic unloading

A lighting dome that can be used to inspect semiconductor wafers can include a small aperture, backlighting, a reflectance gradient and/or a broad spectrum light source.

Lighting domes with reflective gradient and broad spectrum light source

A lighting dome that can be used to inspect semiconductor wafers includes a small aperture, and can include backlighting, a reflectance gradient and/or a broad spectrum light source. A pin hole lens is aligned with the small aperture.

Lighting domes with pin hole lens

Growing community of inventors

Katy, TX, United States of America

Christopher Jan Koci