Teradyne, Inc.

Christopher J Bruno

Philip Luke Campbell

Adnan Khalid

John P Toscano

Christopher Croft Jones

Mark S O'Brien

Evgeny Polyakov

Marc LeSueur Smith

Jianfa Pei

Michael O McKenna

David Graziose

Mark J Estrella

An example test socket for a test system includes a receptacle to make electrical and mechanical connections to a device under test (DUT) and a lid to cover the DUT in the receptacle. The lid is controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle. Closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT.

Test socket having an automated lid

An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.

Modular automated test system

An example test system includes test sites comprising test sockets for testing devices under test (DUTs) and pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets. Each picker may include a picker head for holding a DUT. The test system also includes a gantry on which the pickers are mounted. The gantry may be configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets. The test sockets are arranged in at least one array that is accessible to the pickers on the gantry.

Automated test system

An example test system includes test sites that include sockets for testing devices under test (DUTs), pickers for picking DUTs from the sockets or placing the DUTs in the sockets, and a gantry on which the pickers are mounted. The gantry is configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the sockets or placing the DUTs into the sockets. The test system also includes one or more LASER range finders mounted on the gantry for movement over the DUTs in the sockets and in conjunction with movement of the pickers. A LASER range finder among the one or more LASER rangefinders mounted on the gantry is configured to detect a distance to a DUT placed into a socket.

Vision system for an automated test system

An example test system includes a test socket for testing a DUT, a lid for the test socket, and an actuator configured to force the lid onto the test socket and to remove the lid from the test socket. The actuator includes an upper arm to move the lid, an attachment mechanism connected to the upper arm to contact the lid, where the attachment mechanism is configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket, and a lower arm to anchor the actuator to a board containing the test socket. The actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket.

Test site configuration in an automated test system

An example test system includes a tray to hold devices, where the devices include devices to be tested or devices that have been tested; a motor that is controllable to cause vibrations; and a component that couples the motor to the tray to cause the tray to vibrate in response to the vibrations of the motor.

Using vibrations to position devices in a test system

A mechanism for attaching a device interface board (DIB) to a surface of a test head or peripheral includes first and second pulldown mechanisms attached to the surface and a substantially U-shaped actuator. Each of the pulldown mechanisms includes a rotating member coupled to a connecting member via a translation interface. The translation interface converts rotation of the rotating member into vertical movement of the connecting member. The U-shaped actuator has first and second ends respectively coupled to the rotating members of the first and second pulldown mechanisms. Swinging the U-shaped actuator through an arc rotates the rotating members and causes the connecting members to move vertically. A DIB that latches with the connecting members can thus be pulled down against the surface quickly and conveniently, with sufficient mechanical leverage for compressing large numbers of spring-loaded pins.

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Hudson, MA, United States of America

Christopher J Bruno