The Boeing Company

Christopher H Rees

Robert William Grube

Scott H Fife

Dominic N Nwoke

A method for detecting defects includes steps of: (1) calculating an average value for intensity of CT image voxels in a neighborhood; (2) calculating a difference value for the intensity of the voxels in the neighborhood; (3) calculating a standard deviation for the intensity of the voxels in the neighborhood; (4) calculating a z-score for each one of the voxels; (5) identifying a cluster of neighboring ones of the voxels; (6) determining a cluster-boundary parameter of the cluster; and (7) classifying the cluster as a defect when the cluster-boundary parameter of the cluster is above a parameter threshold.

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Seattle, WA, United States of America

Christopher H Rees