Western Digital Technologies, Inc.

Christopher H Aiello

John R Agness

Ryan P Mayo

William K Laird

Joshua E Kay

Amy L Pham

A negative voltage testing including a monitoring and triggering circuit coupled to a supply voltage rail of a device under test (DUT) and a switching circuit coupled to the monitoring and triggering circuit. The monitoring and triggering circuit is configured to cause the switching circuit to provide a first negative voltage to the supply voltage rail when a supply voltage on the supply voltage rail decays below a predetermined level during a first test of the DUT.

Negative voltage testing methodology and tester

A jumper assembly includes a first pin with a first surface discontinuity, and a jumper shunt for providing an electrical connection between the first pin and a second pin. The jumper shunt includes a clip configured to catch on the first surface discontinuity to keep the jumper shunt in contact with the first pin. Another jumper assembly includes a first pin and a blocking portion on the first pin. A jumper shunt is configured to move along the first pin with the blocking portion limiting motion of the jumper shunt along the first pin beyond the blocking portion.

Growing community of inventors

Irvine, CA, United States of America

Christopher H Aiello