International Business Machines Corporation

Christopher G Fredericks

Weng Sing Tang

Tien Hiong Lee

Konstantin Levinski

Xin Qian

Xiang Zhang

A mechanism is provided for detecting one or more defects in an incoming log. One or more features are extracted from the incoming log. Utilizing the one or more features, one or more patterns, one or more pattern sequences of the one or more patterns, and one or more proximities associated with the one or more patterns contained in the incoming log are identified. For each defect model generated for the incoming log, a set of patterns in the defect model is compared to a set of patterns in each previously identified defect model in a set of previously identified defect models. Responsive to identifying a match and responsive to set of scores associated with the match meeting or exceeding a set of probability thresholds, an identification associated with the previously identified defect model along with any solution or workaround is passed to a support engineer.

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Fredericton, Canada

Christopher G Fredericks