Kemeny Associates

Christopher Erwin Zueger

Gabor John Kemeny

Gard Anders Groth

Natalie Ann Crothers

Xu Zhai

Gina Elaine Stuessy

Howland Jones

A spectrometric device for optical analysis of material composition, coating thickness, surface porosity, and/or other characteristics uses several monochromatic light sources&#x2014;e.g., laser diodes&#x2014;to illuminate a sample, with a camera taking an image of the sample under each source's light, and with the various images then being combined to generate a (hyper)spectral image. To address the difficulty in obtaining uniform illumination intensity across the illuminated sample area with solid-state light sources, the output from the light sources may be supplied to an integrating sphere (preferably after being combined within a fiber combiner), and then to a fiber bundle whose output ends are configured as a ring light (a ring of fiber ends directing light at a common spot). The camera may then focus on the spot, at which the sample may be placed for illumination and imaging.

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Chicago, IL, United States of America

Christopher Erwin Zueger