Cytonome/st, LLC

Beckman Coulter, Inc.

Christopher D Lofstrom

Blair D Morad

Coby S Hughey

Daniel Nelson Fox

Thomas L Thrasher

David Neckels

David C Neckels

A fluid handling system for a particle processing instrument includes a pump, a pulse attenuator, a pressure transducer, and a pump controller. The pump may be configured to supply a pulsed flow of fluid having a first pulse characteristic to the pulse attenuator. The pulse attenuator may have a single, undivided, volume, fluid inlets, fluid outlets, and a pressure sensor port. The pulse attenuator may supply an outlet flow of fluid having a second pulse characteristic different from the first pulse characteristic. The pressure transducer may be in fluid communication with the pressure sensor port and in control communication with the pump controller. The pump controller may be in control communication with the pump to maintain a substantially constant nominal pressure within the pulse attenuator by controlling the pump motor.

Fluid handling system for a particle processing apparatus

A fluid handling system for supplying a working fluid to a fluid flow instrument is disclosed. The system includes a controller configured to receive sensor signals indicative of a deformation of a flexible barrier located between a control fluid volume containing a control fluid and a working fluid volume containing the working fluid. Based on the sensor signals, the controller may send signals to control the operation of a working fluid flow generator in order to regulate or control the fluid characteristic of the working fluid being provided to the fluid flow instrument.

Fluid handling system for a fluid flow instrument

A method is provided for generating measurement parameters for a particle sample in a particle analyzer. The method includes, interrogating the particle sample with a triggering interrogator and one or more secondary interrogators respectively positioned along a length of an interrogation area, generating respective pulses based upon the interrogation of a first particle from the particle sample, determining a primary pulse detection window based upon a triggering pulse, determining a search interval to find a secondary pulse based upon factors including the primary pulse detection window and a laser delay, adjusting the search interval for laser delay variation dynamically based on the interrogation of the first particle, identifying the secondary pulse in the adjusted search interval, and processing the secondary pulse to determine a peak value of the secondary pulse. Corresponding apparatus are also provided.

Generating pulse parameters in a particle analyzer

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Fort Collins, CO, United States of America

Christopher D Lofstrom