The Ohio State University

Iomega Corporation

Ohio University

Christopher D Hahm

Bharat Bhushan

Marty Lee Stout

Stephanie Seaman

An apparatus has an information storage medium with an information storage surface, and structure operable to effect relative movement of the head and surface within a first zone while maintaining the head adjacent the surface and while using the head to effect at least one of reading information from and writing information to the surface. A head cleaning section includes a cleaning part engageable with the head when the head is in a second zone where the head is spaced from the surface, the structure being operable to effect relative movement of the engaged head and cleaning part in a manner which includes a component of movement that is representative of an applied force subject to a damping influence.

Method and apparatus for cleaning head with over-damped harmonic oscillation

The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Method for measuring film thickness using capacitance technique

Capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Pin and cup devices for measuring film thickness

Liquid dielectric capacitor for film thickness mapping

The present invention includes capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Liquid dielectric capacitor for film thickness mapping, measurement methods using same

The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Also disclosed is a device and technique for determining film thickness by suspending the film in a liquid dielectric. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

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Roy, UT, United States of America

Christopher D Hahm