Intel Corporation

Other

Christopher Connor

Bruce Querbach

Rahul Khanna

Zion S Kwok

Hanmant Pramod Belgal

Philip Hillier

Jeffrey W Ryden

Gordon McFadden

Shailesh Kumar Madisetti

James O'donnell

A thin film transistor (TFT) structure. In an example, the TFT includes a gate electrode, a first layer comprising an oxide semiconductor material, and a second layer between the first layer and the gate electrode. The second layer is crystalline and is in contact with the first layer, and includes zirconium and oxygen. The TFT includes a first contact coupled to the first layer at a first location, and a second contact coupled to the first layer at a second location. In some cases, the second layer further includes hafnium. In some cases, the TFT includes a third layer between of the gate electrode and the second layer, the third layer comprising a metal and oxygen. The gate electrode may also include the metal. In some cases, hydrogen is present at an interface between the gate electrode and the second layer.

Gate dielectric for thin film oxide transistors

An embodiment of a semiconductor apparatus may include technology to convert an analog voltage level of a memory cell of a multi-level memory to a multi-bit digital value, and determine a single-bit value of the memory cell based on the multi-bit digital value. Some embodiments may also include technology to track a temporal history of accesses to the memory cell for a duration in excess of ten seconds, and determine the single-bit value of the memory cell based on the multi-bit digital value and the temporal history. Other embodiments are disclosed and claimed.

Memory cell including multi-level sensing

A method is described. The method includes monitoring reliability, power consumption and performance of a processor and writing reliability, power consumption and performance data of the processor into an embedded non-volatile random access memory that is integrated into the processor's semiconductor chip.

Processor having embedded non-volatile random access memory to support processor monitoring software

A processor semiconductor chip is described. The processor semiconductor chip includes at least one processing core. The processor semiconductor chip also includes a memory controller. The processor semiconductor chip also includes an embedded non flash non-volatile random access memory having a stack of storage cells disposed above the processor semiconductor chip's semiconductor substrate. The embedded non-volatile random access memory is to store boot up program code that, when executed by the processor semiconductor chip, is to analyze a subsequent module of program code so that a maliciously modified version of the subsequent module of program code can be identified. The embedded non-volatile random access memory to also store the subsequent module of program code.

Secure boot processor with embedded NVRAM

Examples include techniques for booting a computing system. A processor semiconductor chip includes one or more processing cores and an embedded non-volatile random-access memory (NVRAM), the NVRAM storing instructions that when executed by the one or more processing cores manages a boot process for a computing system.

Booting a computing system using embedded non-volatile memory

In one embodiment, a non-volatile memory is controlled in a selectable read mode in response to commands from a processor. Selectable read modes may include a default read memory mode, for example, and a performance read memory mode having a shorter read pulse and a reduced read latency than the default read memory mode, for example. In one embodiment, the performance read memory mode may also have refresh operations at an increased frequency compared to that of the default read mode. Other aspects and advantages are described.

Selective performance level modes of operation in a non-volatile memory

Embodiments detailed herein include an apparatus that includes a reliability assessment engine (RAE) stored in non-volatile memory and processing circuitry to execute the RAE to: receive data of at least one physical condition from a plurality of intra-die variation monitoring circuits, apply the received data least one to at least one reliability physics model, and calculate at least one of an estimated amount of lifetime consumed and an estimated amount of lifetime remaining.

Integrated circuit reliability assessment apparatus and method

A predetermined pattern of bits is written to a non-volatile memory device prior to powering down the non-volatile memory device. A plurality of voltages are applied to the non-volatile memory device to determine which voltage of the plurality of voltages allows the predetermined pattern of bits to be read with a least amount of error. The determined voltage is set to be a demarcation voltage for reading from the non-volatile memory device.

Determination of demarcation voltage for managing drift in non-volatile memory devices

An intraocular light probe has a mask or shield affixed at its distal end thereof which forms a directed light beam for intraocular application of light to target tissues or intraocular application of therapeutic light. The mask or shield serves to more fully focus, intensify and direct the beam toward the target tissues. The mask or shield also helps direct light away from other tissues and away from the eyes of the surgeon. By placing a light probe beneath a surgical instrument such as a phacoemulsifier or vitrector, laser, cutting instrument (e.g., scissors or knife), forceps or probe/manipulator, whether as part of or separate from an infusion sleeve, a mask or shield effect is created. This has the same benefits of directing the beam toward target tissues, away from other tissues and away from the eyes of the surgeon. The mask/shield can be removed from the fiberoptic light for sterilization. The device of the invention is preferably introduced into the eye via the primary or side-port incision to provide intraocular cross-lighting of tissues during surgical procedures such as cataract surgery, corneal surgery, vitrectomy, intraocular lens implantation, refractive surgery, glaucoma surgery and vitreo/retinal surgery.

Shielded intraocular probe for improved illumination or therapeutic application of light

An intraocular light probe has a mask or shield affixed at its distal end thereof which forms a directed light beam for intraocular illumination of target tissues or intraocular application of therapeutic light. The mask or shield serves to more fully focus, intensify and direct the beam toward target tissues. The mask or shield also helps direct light away from other tissues and away from the eyes of the surgeon. This lessens unwanted glare. By placing a light probe beneath a surgical instrument such as a phacoemulsifier or vitrector, laser, cutting instrument (e.g., scissors or knife), forceps or probe/manipulator, whether as part of or separate from an infusion sleeve, a mask or shield effect is created. This has the same benefits of directing the beam toward target tissues, away from other tissues and away from the eyes of the surgeon.

An intraocular light probe has a mask or shield at its distal end which forms a directed light beam for intraocular illumination of target tissues or application of therapeutic light. The mask or shield serves to more fully focus, intensify and direct the beam toward the target tissues and directs light away from other tissues and away from the eyes of the surgeon, lessening unwanted glare. The probe may be placed beneath a surgical instrument, whether as part of or separate from an infusion sleeve. The mask or shield is opaque or semi-opaque and made of a soft, semi-rigid or rigid material. The shield can be rigid enough to serve as the shaft of an instrument with a probe or manipulator at its distal tip. It may also be reflective on the side adjacent to the fiber bundle to help direct, magnify, and intensify the beam of light.

An intraocular light probe has a slit-shaped mask or cannula affixed at a distal end thereof which forms a slit-shaped light beam for intraocular slit-illumination of target features within the eye. A hood at a distal tip portion directs light in a particular direction. A distal flange retains the instrument within the eye. In a second embodiment, a light probe for intraocular application of a slit-shaped light beam is created by forming a slit shape at a distal end of an optical fiber bundle. A third embodiment provides a surgical instrument, such as a phacoemulsifier or vitrector, having an infusion sleeve which incorporates a slit illuminator for intraocular application of a slit-shaped light beam to target tissues. The device of the invention is preferably introduced into the eye via the primary or side-port incision to provide intraocular cross-lighting of tissues during surgical procedures such as cataract extraction, vitrectomy, intraocular lens implantation, refractive surgery, and glaucoma surgery.

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Hillsboro, OR, United States of America

Christopher Connor