Jds Uniphase Corporation

Qed Technologies International, Inc.

Christopher Brophy

Eliseo R Ranalli

Dale A Buralli

Paul Murphy

Greg W Forbes

Steve Chakmakjian

Gary Devries

Greg Forbes

A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuring gauge having a limited capture range of wavefront shapes collects partially overlapping subaperture measurements over the test object. A variable optical aberrator reshapes the measurement wavefront with between a limited number of the measurements to maintain the measurement wavefront within the capture range of the wavefront-measuring gauge. Various error compensators are incorporated into a stitching operation to manage residual errors associated with the use of the variable optical aberrator.

Stitching of near-nulled subaperture measurements

An multiport, multi-wavelength optical switch having and array of angular beam-directing devices employs an anamorphic optical system that transforms a beam corresponding to a given wavelength of a given multi-wavelength input channel into a beam, at a plane of the angular beam-directing device array, having an elliptical Gaussian-beam waist in the angular-directing direction of the beam-directing device and in the orthogonal direction, with the waist in the angular-direction being larger than the waist in the orthogonal direction. Planar and non-planar emitter/receivers for use with the switch are disclosed.

Multiport wavelength-selective optical switch

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Pittsford, NY, United States of America

Christopher Brophy