Freescale Semiconductor,inc.

Christopher B Lesher

Randall C Gray

William Ernest Edwards

A method of testing a semiconductor device includes forming a test circuit over a semiconductor substrate. The test circuit includes a plurality of interconnects electrically connected to a set of device structures supported by the semiconductor substrate. A test, such as a gate stress or leakage current test, of each device structure is conducted with the test circuit. The plurality of interconnects are removed after conducting the test.

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Gilbert, AZ, United States of America

Christopher B Lesher