Scientific Technologies Corporation

Ethicon, Gmbh

Omron Scientic Technologies, Inc.

Christopher Alan Dums

John Drinkard

Fred Schleifer

David C Yates

Jeffrey L Aldridge

Benjamin J Danziger

Alejandro Ruiz Sanchez

Abby C Albers

Joseph E Scholler

Javier Onses Cardona

Douglas P Sterlina

Jonathan M Bonte

Various forms are directed to systems and methods apparatus for operating a surgical instrument that includes an adapter configured to couple to a generator. The generator configured to provide an energy signal for treating tissue The adapter includes at least one input port configured to receive the energy signal from the generator, where the energy signal includes an energy component comprising one or more energy modalities. An energy storage circuit is configured to charge and store energy from the generator as a DC output. The adapter also includes at least one output port configured to couple to one or more surgical instruments for treating tissue. The one or more energy modalities comprises any one of an ultrasonic, a bipolar radio frequency (RF), a monopolar RF, a reversible electroporation, an irreversible electroporation, or a microwave component, or any combination thereof.

Adapter for electrical surgical instruments

Zone selection logic in an area monitoring device increases the number of unique monitoring zone selections that can be selected using a limited number of discrete zone selection inputs, without compromising the safety critical operation of zone selection. The device monitors the logical state of each input in a set of individual inputs and recognizes each unique logical combination of zone selection inputs as a different zone selection. For example, each of two or more configured monitoring zones is associated with a different combinatorial zone selection pattern of asserted zone selection input signals. Correspondingly, a control circuit within the area monitoring device is configured to monitor the discrete zone selection inputs and activate a given one of the configured monitoring zones based on recognizing the associated combinatorial zone selection pattern of asserted zone selection signals.

Method and apparatus for zone selection in area monitoring devices

A data reduction circuit serves as a post-processor for digitized waveform data, providing reduced data sets for subsequent processing. Preferably, the data reduction circuit receives one or more potentially long sequences of digital waveform data and provides as output sets of sequence numbers corresponding to transitions in the digitized waveforms. In this manner, a processor concerned with the location of waveform transitions is relieved from the burden of processing the sequences just to identify the transition points. In some embodiments, the data reduction circuit cooperates with a waveform digitizer that produces digitized sequences of comparator waveforms in a laser-based distance measuring circuit. Transition points in the digitized waveform correspond to return reflections of emitted laser pulses and may be used to identify laser pulse flight time. Thus, reporting only sequence numbers for the waveform transition points greatly reduces the amount of data transferred to a distance-calculating processor.

System and method for waveform processing

A circuit generates a test signal useful in verifying the actual delay values of individual delay stages in a digital delay line. In general, the cumulative delay of the delay line defines a window in time having its zero point anchored to the beginning of the delay line. Successive delay stages correspond to successive time bins within the overall time window. The test signal shifts at a known, linear rate in time with respect to a reference signal, which is used to initiate a test cycle. The reference signal synchronizes sampling of the test signal to the beginning of the time window. Samples of the test signal are taken at sample points determined by the actual time delays in the successive delay stages. The observed distribution of test signal edges across the time window may be used to determine the actual delay intervals of the delay line.

System and method for delay line testing

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Clayton, NC, United States of America

Christopher Alan Dums