Synopsys, Inc.

Christophe Suzor

John Kim

Brian Scott Gordon

Karen Movsisyan

Rafik Marutyan

A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set of test results stored in memory; generating a yield model of the manufactured devices parsed by the set of attributes; populating the yield model based on the set of test results; and utilizing a processor to perform statistical analysis of the populated yield model to extract fail rates of the selected subset of attributes.

Extracting attribute fail rates from convoluted systems

A method, system or computer usable program product for automatically identifying layout pattern candidates in selected regions for use in analyzing semiconductor device performance issues including identifying a set of target regions and a set of reference regions from a design layout; utilizing a processor to generate a reference baseline of layout patterns from the set of reference regions; utilizing the processor to compare a frequency profile of layout patterns in the set of target regions to a frequency profile of layout patterns in the reference baseline; and based on the comparison, utilizing the processor to identify candidate layout patterns from the set of target regions for further analysis.

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Mimet, France

Christophe Suzor