Illumina Corporation

Christophe Sigel

Simon Prince

Danilo Condello

David E Hargis

John O'Shaughnessy

Ashkan Arianpour

Jeffrey Bendick

John O'shaughnessy

Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission ('ASE') mode, but below a power level for single mode operation.

Systems and methods for improved focus tracking using a hybrid mode light source

An imaging system including a light source; a first focusing lens positioned to focus a beam from the light source to a beam waist at a predetermined location along an optical path of the beam in the imaging system; a beam splitter positioned relative to the first focusing lens to receive the beam from the first focusing lens and to create first and second beams; a second focusing lens positioned to receive the first and second beams output by the beam splitter, to focus the received first and second beams to a spot sized dimensioned to fall within a sample to be image, and further positioned to receive first and second beams reflected from the sample; an image sensor positioned to receive the light beams reflected from the sample; and a roof prism positioned in the optical path between the second focusing lens and the image sensor.

Systems and methods for improved focus tracking using a light source configuration

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San Diego, CA, United States of America

Christophe Sigel