Jovin Yvon S.a.s.

Christophe Pecheyran

Emmanuel Fretel

Alain Le Marchand

This invention concerns a plasma source emission spectrometer to measure a sample comprising an excitation source () having a central axis () and producing a plasma, an extraction enclosure () receiving a beam composed of ions, atoms and electrons () derived from the plasma and comprising an optical lens () collecting luminous radiations emitted by the ion beam (). According to the invention, the lens () is not exposed directly to the plasma. The invention also concerns a sighting device () comprising a metallic structure (), substantially cylindrical having a first () and second () faces ranging respectively in a first () and second () planes. The first face () comprises an input aperture () for a beam () to be analysed and the second face () comprises an output aperture () for said beam (). The first plane () forms an angle &#x3b1; with the normal of the second plane ().

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Pau, France

Christophe Pecheyran