Infineon Technologies Ag

Christoph Boehm

Maximilian Hofer

Robert Kolm

Stefan Schneider

Thomas Jackum

A temperature sensor may include at least one cell. Each one of the at least one cell may include a bi-stable flip-flop having a first branch and a second branch. The first branch may include an asymmetry element. A processor is configured to receive, from each one of the at least one cell, an output signal indicative of an operational state of the bi-stable flip-flop and to determine a temperature based on the received output signals.

Determining a temperature

Disclosed herein are a method, circuitry and an integrated circuit chip for use in signal processing. The integrated circuit chip comprises an operational amplifier, a reference amplifier, and a control unit. The control unit is coupled to the reference amplifier and to the operational amplifier. The control unit is configured to control the reference amplifier based on a signal received from the reference amplifier.

Method and apparatus for use in signal processing

At least one asymmetry element is configured to receive an input signal and is coupled to a first branch of a bi-stable flip-flop comprising the first branch and a second branch. An asymmetry between the first branch and the second branch depends on the input signal. A value indicative of the input signal is determined based on received output signals of a plurality of readout events.

Analog-to-digital conversion

According to one embodiment, a temperature sensing circuit is described comprising a multiplicity of transistor circuits having a multiplicity of different temperature characteristics and a circuit configured to determine a plurality of mismatch values comprising, for each transistor circuit, a mismatch value representing the temperature characteristic of the transistor circuit and to determine a temperature value using the determined plurality of mismatch values.

Temperature sensing circuit and method for sensing temperature

An electronic circuit is described comprising a load, a power supply node, a first transistor coupled between the supply node and the load such that the input at a control terminal of the first transistor controls current flow from the supply node to the load through the first transistor, a current source, a second transistor coupled between the current source and the load such that the input at a control terminal of the second transistor controls current flow from the current source to the load through the second transistor, a control node coupled to the control terminal of the first transistor and the control terminal of the second transistor and a measuring circuit connected to the point of coupling between the current source and the second transistor configured to measure the difference between the current provided by the current source and the current consumed by the second transistor.

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Graz, Austria

Christoph Boehm