Mtu Aero Engines Gmbh

Micro-epsilon Messtechnik Gmbh & Co. Kg

Christian Ziep

Johann Hinken

Wolf-Dieter Feist

Thomas Beller

Maik Richter

The present invention relates to a measuring device for determining the thickness of a dielectric layer on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields which has a rotationally symmetrical wall, an end plate and an open end and is adapted to be positioned with the open end on the dielectric layer. The device further comprises an antenna which is adapted to excite an electro-magnetic field in the resonance cavity, a reflection measuring unit for determining at least one property of the electromagnetic field and an evaluation circuit for determining the thickness of the dielectric layer from the at least one property of the electromagnetic field. A diameter of the rotationally symmetrical wall varies in a longitudinal direction of the resonance cavity.

Device for measuring the thickness of coatings

A probe for a magnetic remanence measurement method, in particular for detecting foreign material deposits and inclusions in hollow spaces, the hollow spaces being formed in a non-ferromagnetic material and the foreign material deposits and inclusions being made of a ferromagnetic material, wherein the probe includes at least one magnetic field sensor, at least one first and one second magnet, the magnets being configured before the at least one magnetic field sensor in a direction of introduction into the hollow space, and being situated relative to one another in such a way that their pole axes run non-parallel to one another.

Growing community of inventors

Munich, Georgia

Christian Ziep