Xcerra Corporation

Atg Luther & Maelzer Gmbh

Christian Weindel

Oleh Yuschuk

Bernd-Ulrich Ott

Stefan Weiss

Peter Brandt

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe. The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

Capacitive test needle for measuring electrically conductive layers in printed circuit board holes

The present invention relates to a testing device and to a method for testing circuit boards, in particular un-equipped or partially-equipped circuit boards. The testing device is a flying probe with a shuttle or two sub-shuttles, which can displace a circuit board to be tested to a test area in an alternating manner. In addition, the sub-shuttles can be used for commonly holding a large circuit board.

Growing community of inventors

Munich, Georgia

Christian Weindel