Advanced Micro Devices Corporation

Christian Warling

Shantanu Sarangi

Eric M Rentschler

Mihir Shaileshbhai Doctor

Nehal Patel

Vikram Chopra

A system, method, and tangible computer readable medium for chip debug is disclosed. For example, the system can include a plurality of functional blocks, a debug path, and a debug bus steering module. The debug path couples the plurality of functional blocks in a daisy chain configuration, where an end functional block from the plurality of functional blocks is at an end of the daisy chain configuration. The debug bus steering module is configured to pass one or more debug signals associated with a first functional block from the plurality of functional blocks along the debug path to the end functional block while a second functional block from the plurality of functional blocks performs one or more power gating cycles.

Chip debug during power gating events

Methods and apparatus are provided that facilitate debugging operations for components that may include different power domains. In an embodiment, an integrated circuit (IC) includes a plurality of hardware sectors, each hardware sector associated with a debug observability circuit that is served by a debug data bus of a debug circuit. The plurality of hardware sectors includes a controlled sector residing in a dynamically-controlled power domain that may be turned off while the power domain of another sector remains on. A selectively switchable data bus component is configured to couple the debug observability circuit associated with the controlled sector to the debug data bus when the power to the controlled sector is on and to switch to bypass the debug observability circuit associated with the controlled sector when the power to the controlled sector is not on.

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Sunnyvale, CA, United States of America

Christian Warling