Litepoint Corporation

National Semiconductor Corporation

Littlepoint Corporation

Lightpoint Corporation

Christian Volf Olgaard

Ruizu Wang

Benny Madsen

Carsten Schau Andersen

Ray Wang

Chen Cao

Thomas Toldborg Andersen

Peter Petersen

Guang Shi

Erdem Serkan Erdogan

Spiros Nikolaos Bouas

Qingjie Lu

Ke Liu

Minh-Chau Huynh

Dirk Walvis

Roman Schilter

Zhiyong Huang

Fei Peng

Rick William Umstattd

Gary Wang

John Christopher Lukez

Wassim El-Hassan

Yen-Fang Chao

Stephen James Bennett

Johan Darmawan

Vakis Papaparaskeva

Qinghui Luo

Dirk Johannes Marius Walvis

Wing Hung Lee

Tsung Wen Lee

Steve Lo

Mathew Philip

Morten Damgaard

Qiang Zhao

Gerard G Socci

Jane Xin-LeBlanc

Guy Shaviv

Qing Lu

Jonathan Barry Hirst

Dennis M Rose

Nabil Ayoub Elserougi

Subramanian Parameswaran

Niels Vinggaard

Xiangdong Zhang

Mohan Bollapragada

Stefan Kildegaard Klukowski

Kevan Smith

Greg Ravenscroft

Kaiyun Cui

Sheguang Yin

He Zhao

Steve Yeung

Wai Lau

Ivan Riis Nielsen

Sang Yui Hon

An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

Removing test equipment intermodulation interference and noise from power spectral density measurements

An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

Removing test equipment noise from power spectral density measurements

System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

System and method for measuring path loss of a conductive radio frequency (RF) test signal path

A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.

System and method for testing a data packet signal transceiver

Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).

System and method for using pulsed radio frequency (RF) signals and a modulated scattering probe (MSP) to enable measurements of distance to and planarity of a surface of a device under test (DUT)

An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.

Correcting error vector magnitude measurements

An example test system includes memory (e.g., one or more memory devices) storing (i) instructions that are executable, and (ii) a mapping function that relates first error vector magnitudes (EVMs) for first symbols to second EVMs for the first symbols, where the first EVMs are corrupted by radio frequency (RF) noise and the second EVMs are corrupted by both RF noise and symbol decoding errors. The test system also includes a decoder to receive a signal from a device under test, and to obtain a third EVM for a second symbol that is based on the signal, where the third EVM is corrupted by both RF noise and a symbol decoding error. One or more processing devices are configured to execute the instructions to adjust the third EVM using the mapping function to correct the symbol decoding error in the third EVM.

System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.

System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive signal testing

System and method for testing a wireless data packet signal transceiver device under test (DUT) in which external control circuitry manages initiation of execution by a tester of test program instructions defining multiple self-terminating test control sequences in one or more desired sequences. The test control sequences may be pre-stored in a tester for subsequent execution under control of control signals sourced externally by the external control circuitry via separate control signals.

System and method for testing data packet signal transceivers with a tester using externally initiated and self-terminating test control sequences

System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP&#x2212;DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.

Method for testing a radio frequency (RF) data packet signal transceiver device under test (DUT) via a wireless signal medium that enables final functional testing of a fully assembled DUT without requiring wired signal connections. System performance characteristics indicative of manufacturing assembly defects, such as defective antennas or subsystem connections, can be performed using over the air (OTA) test signals communicated wirelessly between the DUT and a tester. By using actual DUT performance characteristics determined during earlier manufacturing tests, such as receiver sensitivity and transmitter power, and known power levels available from the tester transmitter, the OTA signal path loss (i.e., attenuation of the wireless signal) can be estimated and used to confirm the final state of system operation.

Method for testing a radio frequency (RF) data packet signal transceiver via a wireless signal path

System and method of testing performance of a data packet signal transceiver (DUT). Multiple DUT signals, with each having a respective DUT transmit power (RDTPn) received by the tester and corresponding to one (IDTPn) of multiple intended DUT transmit powers, for n=1, . . . , m, with a power equal to a minimum IDTP, maximum IDTP, or intermediate IDTP therebetween. Following association of each RDTPn with its IDTPn, a tester signal is sent having a trigger frame and tester transmit output power (TTOP). The trigger frame includes data corresponding to a reported tester transmit power (RTTP), and a desired signal strength (TRSS) of a DUT data packet signal to be received by the tester. A return DUT signal having a RDTPn is received, from which an IDTPn corresponding to the RDTPn is determined and compared to RTTP-TTOP+TRSS. Successive repetitions of such tester and DUT signals and IDTPn comparisons for multiple combinations of values of the TTOP, RTTP and DRSS enable testing reception performance of the DUT, including extracting RSSI measurements, with minimal signal interactions between tester and DUT.

Systems and methods for detecting faulty elements in an active planar antenna array of an extremely high frequency (EHF) wireless communication device. A planar antenna array having a matrix of dual-polarization modulated scattering probes is disposed within a near-field region of the antenna under test (AUT). Electromagnetic energy received from the AUT is converted to a complex electrical signal that is modulated by an electrical modulation signal and radiated as a scattering signal. The resulting electromagnetic scattering signal, received and converted to an electrical signal by another antenna, is used in a holographic image reconstruction operation via a backward-propagation transformation to reconstruct the signal spectrum radiated from the surface of the AUT. A comparison of this reconstructed signal spectrum with a reference signal spectrum radiated from the surface of a known good antenna array enables detection of faulty antenna elements within the AUT.

System and method for over-the-air (OTA) testing to detect faulty elements in an active array antenna of an extremely high frequency (EHF) wireless communication device

A method for testing a data packet signal transceiver device under test (DUT). Following initial signal communications with a DUT, timing of further transmissions by the DUT may be effectively controlled by transmitting congestive communication channel signals to cause the DUT to detect apparent communication channel activity and in response thereto delay its own signal transmissions.

Method for delaying signal transmissions from a device under test (DUT) by transmitting congestive communication channel signals

A method for coordinating testing of a wireless device under test (DUT) using non-link testing resources. Coordination between the tester and DUT is achieved by transmitting, from the tester to the DUT, predetermined numbers of data packets associated with predetermined tester identification data (e.g., MAC addresses identifying the tester transmitter). During test phases involving measurement and/or calibration of DUT transmit signals, the tester sends a number of data packets associated with one or more versions of tester identification data, in response to which the DUT performs internal operations (e.g., revising transmit power offsets). During later test phases involving validation of DUT performance, the tester sends another number of data packets associated with one or more versions of the tester identification data to inform the DUT that its testing has passed or failed, and/or is to be repeated.

Method for controlling wireless device under test using non-link testing resources

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Saratoga, CA, United States of America

Christian Volf Olgaard