Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Carl Zeiss Microimaging Gmbh

Carl Zeiss Nts Gmbh

Fliesenmarkt Herberhold Gmbh

Christian Thomas

Martin Edelmann

Torsten Sievers

Alexander Thesen

Uwe Wolf

Christian Wojek

Andreas Nolte

Heino Heise

Ulrich Kohlhaas

Lucian Stefan

Dmitry Lysenkov

Thomas Albrecht

Tekie Ogbazghi

Michael Dickopf

Hans-Dieter Geuking

Johannes Lahr

A slide system for optical microscopy using immersion fluid including a cover glass having a first refractive index and a transparent film having a second refractive index. The second refractive index of the transparent film is matched to the first refractive index of the cover glass. The transparent film protects the cover glass from immersion fluid used for optical microscopy and the transparent film is configured such that the immersion fluid used can be removed by lifting off the transparent film.

Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy

For the microscopy of an object using a combination of optical microscopy and particle beam microscopy, a microscope slide system comprises an electrically conductive holder, wherein at least one window is configured in the holder, and wherein the holder has the dimensions of a standard glass microscope slide for the optical microscopy; a microscope slide element, which is designed to carry the object for the microscopy and which is designed such that the element can be placed over the window; and a fastening device, which is designed to fix the microscope slide element over the window. By means of said microscope slide system, the object can be analyzed using separate microscopes, without having to relocate the object.

An observation and analysis unit that magnifies an image of a sample and further accomplishes the evaluation and analysis thereof. The observation and analysis unit includes a light-microscopic device designed for the magnified imaging and optical evaluation of the sample and a sample analyzer that analyzes selected regions of the sample. The sample analyzer includes an electron source from which an electron beam can be directed to a region of the sample selected by use of the light-microscopic device. The sample analyzer further includes an X-ray detector designed to detect X-ray radiation generated by the interaction of the electron beam with the sample material. The unit further includes an actuation and evaluation unit that generates control commands for the light-microscopic device and the electron source and spectrally analyzes the X-ray radiation.

Observation and analysis unit

The invention provides a method for the magnified depiction of samples, wherein at least two sections from a sample, which are present on at least one sample carrier, are depicted in magnified form using an apparatus for the magnified depiction of samples, wherein the sample carrier is connected to the apparatus via a sample carrier holder, wherein the position of the depicted sample carrier regions in relation to the apparatus and the magnification stage used are recorded, at least one selected feature contained in the image information from the sections depicted in magnified form, particularly at least one suitable contour and/or structure, is/are used to define local coordinate systems, which are specific to the respective section, for the at least two sections depicted in magnified form, at least one region within at least one of the sections depicted in magnified form is/are selected (selection region) and the relative position of this at least one selection region in relation to the local coordinate system defined for the respective section, and the position of said selection region in relation to the apparatus, are ascertained, the relative position of this at least one selection region is transmitted to the local coordinate system of the at least one further section depicted in magnified form in order to stipulate at least one corresponding adjacent region on this section, the position of the adjacent region in relation to the apparatus is ascertained, and the at least one previously stipulated selection region and/or the at least one corresponding adjacent region is/are approached by the apparatus and depicted in magnified form, preferably at high magnification. In addition, the invention provides an apparatus&#x2014;that is set up to carry out the method&#x2014;for the magnified depiction of samples and also a computer program product which prompts an apparatus for the magnified depiction of samples to carry out the method.

Automated imaging of predetermined regions in series of slices

A detection device and a particle beam device having a detection device ensure a good efficiency in detecting interaction particles and electromagnetic radiation. The detection device has a detector for detecting electromagnetic radiation and/or interaction particles and a filter element through which the electromagnetic radiation is transmitted. The filter element prevents the interaction particles from striking the detector such that the filter element is situated to move between a first position and a second position, the filter element in the first position being situated in relation to the detector in such a way that the filter element prevents the interaction particles from striking the detector. The filter element in the second position is situated in relation to the detector in such a way that the filter element allows the interaction particles to strike the detector. As an alternative, the filter element may be an object holder.

Detection device and particle beam device having a detection device

For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier () is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Specimen holder having alignment marks

Growing community of inventors

Ellwangen, Germany

Christian Thomas