Ventana Medical Systems, Inc.

Christian Roessler

Michael Otter

Brian Howard Kram

Yao Nie

Daniel Bauer

Nathan Crum

Timothy James Keller

Evan T Graves

Heidi Barnett

Kenneth S Weir

Samuel Psota

James E Phillips-Portillo

Patrick Brown

Alastair Laing

Nazim Shaikh

Daniel R Kurycki

Jr John D Willems

Matthew D Mette

A method and system for classifying field of view (FOV) images of histological slides into various categories that include certain stain patterns, artifacts, and/or other features of interest are provided herein. Few-shot learning (e.g., a prototypical network) techniques are used to train a deep convolutional neural network using a small number of training samples for a small number of image classes for classifying stain images belonging to a larger number of image classes.

Histological stain pattern and artifacts classification using few-shot learning

In some embodiments, the present disclosure is directed to coatings or thin films comprising a dye or stain embedded within a matrix, e.g. a polymer matrix.

Calibration slides for digital pathology

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Oro Valley, AZ, United States of America

Christian Roessler