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Bruker Axs Gmbh

Bruker Axs Se

Christian Maurer

Lutz Brügemann

Cristian Venanzi

Jürgen Fink

Bob Baoping He

Christoph Ollinger

Olaf Meding

Bob Boaping He

In summary, the present invention proposes embodying an X-ray detector () with a plurality of detector modules (-), each comprising dead zones () without X-ray sensitivity and active zones (-) with X-ray sensitivity that is spatially resolved in a measurement direction (MR), wherein the detector modules (-) are embodied successively and in an overlapping fashion along the measurement direction (MR), such that in overlap regions (-) the dead zone () of one detector module (-) is bridged by an active zone (-) of another detector module (-). The overlapping detector modules (-) are arranged next to one another in the transverse direction (QR) in the overlap regions (-), wherein the transverse direction (QR) runs transversely with respect to the local measurement direction (MR) and transversely with respect to a local connection direction (VR) with respect to a sample position (). The X-ray detector () makes it possible, in a simple manner, to obtain gapless, one-dimensional measurement information, in particular X-ray diffraction information, from a measurement sample () at the sample position ().

Measurement arrangement for X-ray radiation for gap-free 1D measurement

A measuring arrangement () for x-ray radiation, comprising&#x2014;a sample position (), which can be illuminated by xray radiation () and&#x2014;an x-ray detector () for detecting x-ray radiation emitted from the sample position (), comprising at least one detector module (-), wherein the detector module (-) has a plurality of sensor elements (-) arranged successively in a measuring direction (MR), each sensor element having a centroid (), wherein the sensor elements (-) are arranged in a common sensor plane () of the detector module (-), is characterized in that at least a majority of the sensor elements (-) of the detector module (-), preferably all the sensor elements (-) of the detector module (-), are designed as uniformly spaced sensor elements (-), wherein the centroids () of the sensor elements (-) have an equal distance Rfrom the sample position (). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.

Measuring arrangement for x-ray radiation having reduced parallax effects

An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.

Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector

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Karlsruhe, Germany

Christian Maurer