Fairchild Semiconductor Corporation

Semiconductor Components Industries, LLC

Christian Klein

Myron J Miske

Nickole Gagne

John R Turner

Gregory A Maher

Tyler Daigle

Seth M Prentice

Oscar W Freitas

Robert A Card

Peter Chadbourne

James J McDonald, Ii

Michael Smith

Jefferson Hopkins

Jaeyoung Yoo

Derek Richardson

An embodiment of an electronic marker circuit for a USB cable may be configured to detect and error condition on one or more of the USB signals and apply a signal to one of the USB signal that is representative of the cable being disconnected from a source or sink device even if the cable is still physically connected.

USB electronic marker circuit and method therefor

This document discusses, among other things, circuits and methods for providing an indication of an impedance between a detecting pin and a first signal pin of an audio socket using first and second comparators to, among other things, determine if moisture is present in the audio socket. If moisture is present in the audio socket, communication between an audio processing unit and the audio socket can be disabled.

Audio jack insertion/removal fault detection

An apparatus comprises an integrated circuit (IC) comprising an external IC connection, an IC substrate connection, a voltage clamp circuit and an under voltage circuit. The voltage of the IC substrate connection is set to a first voltage when a voltage of the external connection of the IC is within a normal operating voltage range. The voltage clamp circuit is configured to clamp the voltage supply of one or more circuits internal to the IC to within a normal operating voltage range when the voltage of the external IC connection exceeds the normal operating voltage range. The under voltage circuit is communicatively coupled to the clamp circuit and configured to set the voltage of the substrate to a second voltage when the voltage at the external IC connection of the IC is less than zero volts.

Under voltage tolerant clamp

This document discusses, among other things, an attack detection module configured to permanently shut down a slave device after a number of consecutive attacks.

Permanent lockout attack detection

Method and apparatus, among other things, are provided for detecting a charger type. In an example, a method to classify a potential charger coupled to a port of an electronic device can include detecting the potential charger coupled to a USB-compatible port of the electronic device, applying a pull-down current to first and second data lines of the USB-compatible port to provide a first test voltage on each of the first and second data lines, and executing a primary detection process of a USB Battery Charging 1.2 Compliance Plan if the first test voltage on each of the first and second data lines is not between a first threshold and a second threshold using the pull-down current.

Charger detection with proprietary charger support

Apparatus and method are described, illustratively in an LVLS master/slave system, for detecting a circuit failure, shutting down the system as if a normal power down function has occurred, but restarting the system. Signals, including power and ground lines are monitors, mal-functions detected and the apparatus put into a power down sequence. Illustratively in the LVLS system, driving a signal line to either the power or ground rails is used as a signal to the apparatus to enter the power down sequence. The present invention, after a programmable time, then drives the signal line to the opposite rail thereby signaling the system to restart&#x2014;a wake up mode. After a programmable time, the signal line is released and the system resumes normal operation.

Method and apparatus for detecting and recovering from external electrical disturbances

A buffer circuit with slow output edges is described. Pulsed higher value currents are driven from one shot timing circuits to inject a pulse of current into the control gate of the buffer's output MOSFET to speed up the beginning of the turning on or the turning off of the output MOSFT. When the beginning and turning on and off is reached lower value current sources continue to drive the gate of the output MOSFET. In one embodiment, one shots are triggered from the rising and falling edges of the input signal. The effect of the higher value current pulses is to reduce the circuit delay through the buffer. Also, the pulse width can be designed as temperature sensitive, and supply voltage sensitive so as to maintain the buffer circuit delay as substantially constant as temperature, supply voltage and process variation occur.

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Portland, ME, United States of America

Christian Klein