Carl Zeiss X-ray Microscopy, Inc.

Carl Zeiss Industrielle Messtechnik Gmbh

Xnovo Technology Aps

Danmarks Tekniske Universitet of Anker Engelundsvej

Danmarks Tekniske Universitet

Christian Holzner

Michael Feser

Erik Mejdal Lauridsen

Michael Totzeck

Uwe Wolf

Lars Omlor

Stefan Othmar Poulsen

Diana Spengler

Danny Krautz

Christoph-Hilmar Graf Vom Hagen

Christoph Hilmar Graf Vom Hagen

Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.

Method and device for additive manufacturing utilizing simulation test results of a workpiece

A method and system for three dimensional crystallographic grain orientation mapping illuminates a polycrystalline sample with a broadband x-ray beam derived from a laboratory x-ray source, detects, on one or more x-ray detectors, diffracted beams from the sample, and processes data from said diffracted beams with the sample in different rotation positions to generate three dimensional reconstructions of grain orientation, position, and/or 3-D volume. A specific, cone beam, geometry leverages the fact that for a point x-ray source with a divergent beam on reflection of an extended crystal grain diffracts x-rays such that they are focused in the diffraction plane direction.

Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities

An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.

X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities

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Wettringen, Germany

Christian Holzner