Trinamix Gmbh

Christian Bonsignore

Patrick Schindler

Peter Schillen

Robert Send

Michael Eberspach

Benjamin Rein

Ingmar Bruder

Christian Lennartz

Friedrich Schick

Andre Schmidt

Lars Diesselberg

Heiko Hengen

Jakob Unger

Peter Fejes

Christoph Lungenschmied

Ruben Huehnerbein

Edgar Matevosjan

Nils Berner

Jan David Alexander Koloczek

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Disclosed herein is a method for alignment of optical components of a projector for illuminating at least one object with at least one illumination pattern including a plurality of illumination features. The projector includes at least one array of emitters. Each of the emitters is configured for generating at least one light beam. The projector includes at least one transfer device configured for generating the illumination features from the light beams impinging on the transfer device.

Method for alignment of optical components of a projector

Disclosed herein is a display device including

Depth measurement through display

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

Described herein is a projector for illuminating at least one object with at least two illumination patterns. The projector includes at least one tunable laser source and at least one diffractive optical element. The projector is configured to generate the at least two illumination patterns each including a plurality of illumination features by controlling at least one property of the tunable laser source. The projector includes at least one control unit. The control unit is configured for controlling the at least one property of the tunable laser source.

Detector with a projector for illuminating at least one object

Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles, unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

Described herein is a method for calibrating a detector including at least one camera and at least one projector. The projector is configured for illuminating at least one target with at least one predefined illumination pattern including a plurality of illumination features. The camera has at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, where each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a light beam propagating from the target to the camera. The target includes at least one first target and at least one second target. The first target and the second target have a predefined fixed relative distance. The target is positioned at a pre-defined distance from the detector.

One shot calibration

Described herein is a method for determining a filling level in at least one storage unit. The method includes

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Ludwigshafen, Germany

Christian Bonsignore