Koninklijke Philips Corporation N.v.

Fei Comapny

Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno

Christiaan Kok

Johannes Wilhelmus Maria Jacobs

Thomas Koehler

Gereon Vogtmeier

Herfried Karl Wieczorek

Heidrun Steinhauser

Herman Stegehuis

Antonius Maria Bernardus Van Mol

Sandeep Unnikrishnan

Dorothee Christine Hermes

Peter Lex Alving

Alessandro Guido Radaelli

Bernd Rieger

Robertus Marinus Wilhelmus Raaijmakers

Marinus Johannes Van Der Zande

The invention relates to a combined detector () comprising a gamma radiation detector () and an X-ray radiation detector (). The gamma radiation detector () comprises a gamma scintillator array (), an optical modulator () and a first photodetector array () for detecting the first scintillation light generated by the gamma scintillator array (). The optical modulator () is disposed between the gamma scintillator array () and the first photodetector array () for modulating a transmission of the first scintillation light between the gamma scintillator array () and the first photodetector array (). The optical modulator () comprises at least one optical modulator pixel having a cross sectional area (') in a plane that is perpendicular to the gamma radiation receiving direction (). The cross sectional area of each optical modulator pixel (&#x2032;) is greater than or equal to the cross sectional area of each photodetector pixel ().

Protection of a gamma radiation detector with an optical modulator to modulate an amount of transmission between a gamma scintillator array and a first photodetector array

An X-ray imaging apparatus (IA) having a plurality of X-ray sources (sj) comprising an anti-scatter grid (ASG) for X-ray imaging comprising at least two sets (Mj) of linear x-radiation opaque strips (STj). Each of the strips in the at least two sets have a respective longitudinal axis (Li). There are at least two strips from different sets of the at least two sets that have non-parallel longitudinal axes.

X-ray imaging apparatus for compact (quasi-)isotropic multi source x-ray imaging

The present invention relates to a device for aligning an X-ray grating to an X-ray radiation source, the device () comprising at least two flat X-ray grating segments (-); at least one alignment unit (-) for aligning one of the at least two flat X-ray grating segments; wherein the at least two flat X-ray grating segments (-) are arranged in juxtaposition and are forming an X-ray grating (); wherein the at least two flat X-ray grating segments (-) each comprise a grating surface (-) for X-ray radiation, each grating surface (-) comprising a geometrical center; wherein normals (-) to each of the grating surfaces (-) define a common plane (), wherein the normals (-) intersect the geometrical center of the grating surface (-); wherein at least a first of the at least two flat X-ray grating segments (-) is rotatable around an axis (-) that is perpendicular to the common plane (); and wherein the first of the at least two flat X-ray grating segments (-) that is rotatable around the axis (-) is connected to a first of the at least one alignment unit (-). The invention provides a device () and a method () which provide an improved X-ray grating ().

Device and method for aligning an X-ray grating to an X-ray radiation source, and X-ray image acquisition system

The invention relates to a combined imaging detector for detection of gamma and x-ray quanta comprising an x-ray detector () for generating x-ray detection signals in response to detected x-ray quanta and a gamma detector () for generating gamma detection signals in response to detected gamma quanta. The x-ray detector () and the gamma detector () are arranged in a stacked configuration along a radiation-receiving direction (). The gamma detector () comprises a gamma collimator plate () comprising a plurality of pinholes (), and a gamma conversion layer () for converting detected gamma quanta into gamma detection signals.

Combined imaging detector for x-ray and nuclear imaging

An anti-scatter device () for an X-ray detector () is provided. The anti-scatter device () comprises an anti-scatter grid () with a plurality of slats () for absorbing X-rays and a cover element () arranged on a side () of the anti-scatter grid (), wherein ends () of the slats () are coupled to the cover element (), and the cover element () comprises an electroactive polymer material. A dimension of the cover element () is changeable by applying a voltage to the electroactive polymer material, such that a distance between the ends () of the slats is changeable by applying the voltage.

Variable focus X-ray anti scatter device

A lens of particle-optical apparatus, such as the objective lens, suffers from aberrations. As is already known since decades Ronchigrams can be used to determine these aberrations of particle-optical lenses. Such methods rely e.g. on the determination of the 2derivative of the aberration function on the basis of local magnification in one or a set of Ronchigrams. Being dependent on the 2derivative the mathematics of these methods allow only (infinitesimal) small shifts between the Ronchigrams. However, this implies that e.g. the spatial quantization noise of the camera recording the Ronchigrams results in a large error. These conflicting requirements limit the accuracy and thus the usefulness of the known methods. The invention describes a set of algorithms which result in an improved method to quantify the lens aberration coefficients using a set of Ronchigrams.

Method for determining the aberration coefficients of the aberration function of a particle-optical lens

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Eindhoven, Netherlands

Christiaan Kok