Fluke Corporation

Chris W Lagerberg

Edmond C Eng

Fang Li

Jinbo He

Roger Stark

John K Ikeda

Duncan Nigel Kearsley

Larry E Eccleston

David J Gibson

John Renner, Iii

A clamp meter includes a meter body and a clamp jaw assembly mounted to the meter body. The clamp jaw assembly includes a first clamp jaw and a second clamp jaw that are movable in relation to each other between a closed position and an open position. In the closed position, distal ends of the first and second clamp jaws meet to define an enclosed area between the first and second clamp jaws, and in the open position, the distal ends of the first and second clamp jaws separate from each other to define a gap allowing a wire under test to pass therethrough. The clamp meter further includes a locking slider positioned within a slot inside the meter body. A switch assembly moves the locking slider longitudinally within the slot between locked and unlocked positions. In the locked position, the locking slider blocks the first clamp jaw from movement.

Clamp meter

A clamp meter includes a meter body and a clamp jaw assembly mounted to the meter body. The clamp jaw assembly includes a first clamp jaw and a second clamp jaw which are movable in relation to each other between a closed position and an open position. In the closed position, distal ends of the first and second clamp jaws meet to define an enclosed area between the first and second clamp jaws, and in the open position, the distal ends of the first and second clamp jaws are separate from each other to define a gap allowing a wire under test to pass therethrough. The clamp meter further includes a locking member mounted within the meter body. The locking member is operable to releasably lock the first and second clamp jaws in the closed position.

Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.

Method and apparatus for indexing an adjustable test probe tip

A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.

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Seattle, WA, United States of America

Chris W Lagerberg