Avago Technologies General IP (singapore) Pte. Ltd.

Avago Technologies International Sales Pte. Limited

Chris Chung

Jin Jeong

Michael Leary

Ah Ron Lee

Domingo Figueredo

YongIk Choi

Deog Soon Choi

Li Sun

Sarah Kay Haney

Chang Kyu Choi

William Lam

Young Ho Lee

Tae Eun Kim

Nitesh Kumbhat

Ashish Alawani

Hyun Mo Ku

Yonglk Choi

Yong-Ik Choi

In some aspects, the disclosure is directed a module for improving mechanical, electrical, or thermal performance. In some embodiments, the module includes a bottom surface, a side surface, a first solder bump disposed on the bottom surface, and a second solder bump disposed on the bottom surface. In some embodiments, the bottom surface extends in a first lateral direction and a second lateral direction perpendicular to the first lateral direction. In some embodiments, the side surface extends in a vertical direction perpendicular to the first lateral direction and the second lateral direction. In some embodiments, the second solder bump is adjacent to the side surface. In some embodiments, the first solder bump has a first length in the first lateral direction. In some embodiments, the second solder bump has a second length in the first lateral direction. In some embodiments, the first length is greater than the second length.

Device having solder bump structure for improved mechanical, electrical, and/or thermal performance

A device and substrate are disclosed. An illustrative device includes a substrate having a first surface and an opposing second surface, a solder material receiving curved surface exposed at the second surface of the substrate, a solder resist material that at least partially covers the solder material receiving curved surface such that a middle portion of the solder receiving curved surface is exposed and such that an edge portion of the solder material receiving curved surface is covered by the solder resist material and forms an undercut, and a solder material disposed within the solder material receiving curved surface and within the undercut.

Substrate having undercut portion for stress mitigation

Structure for improved mechanical, electrical, and/or thermal performance having solder bumps with different lengths

A passive component includes a body including a dummy portion and a device portion. The dummy portion and the device portion extend in a first direction and are arranged such that a longitudinal axis of the device portion is offset from a longitudinal axis of the body in a second direction perpendicular to the first direction. The passive component further includes first and second electrical contacts on at least one surface of the body.

Low profile passive components and devices and packages including the same

Stress mitigation structure

A module includes a PCB including a substrate, a component pad and at least one wire pad, an SMT component mounted to a component pad, a wire fence, a mold compound and a top conductive layer. Each wire pad is connected to ground by a corresponding via extending through the substrate, and the wire fence includes wire loops connected to each wire pad. The mold compound is disposed over the PCB, the SMT component and the wire fence, and defines multiple holes extending partially through the mold compound to top-edges of the wire loops, respectively, where a conductive material fills the holes. The top conductive layer is disposed over the mold compound, and is in electrical contact with the conductive material filling the holes. The wire fence, the conductive material, and the top conductive layer provide shielding of the SMT component from electromagnetic radiation.

Module with internal wire fence shielding

A PCB includes a copper seed layer, a dielectric layer provided on the copper seed layer, a first thermal via and a plurality of second thermal vias disposed around the first thermal via. The first thermal via has a first through-hole in the dielectric layer and a first copper portion filled in the first through-hole, and each of the second thermal vias has a second through-hole in the dielectric layer and a second copper portion filled in the second through-hole. A mounting portion configured to mount a semiconductor device thereon is provided on the first copper portion.

Printed circuit board with thermal via

A bonding pad for use in attaching a semiconductor chip to a printed circuit board, includes: a copper layer; an organic layer disposed over the copper layer in a pattern such that part of the copper layer is exposed; and a gold layer disposed over the organic layer and in contact with the exposed part of the copper layer.

Bonding pad for printed circuit board and semiconductor chip package using same

A test socket for connecting a device under test (DUT) electrically to a high-frequency power source comprises a plurality of pogo pins each having an electrode, an electron-to-heat conversion plate supporting bottoms of the pogo pins, the electron-to-heat conversion plate configured to convert kinetic energy of free electrons emitted from the pogo pins to thermal energy, and a heat sink wall formed on the electron-to-heat conversion plate, the heat sink wall having a predetermined height and isolating the plurality of pogo pins from one another.

Semiconductor device test socket

An electromagnetic interference blocking device is provided for blocking electromagnetic interference between transmission lines formed on a surface of a circuit board. The electromagnetic interference blocking device includes a body configured to be inserted into a slot formed in the surface of the circuit board between the transmission lines, the body including a bottom portion having a comb shape insertable within the slot.

Electromagnetic interference blocking device and circuit assembly including the same

A loading apparatus for loading a printed circuit board (PCB) stack including one or more PCB layers and transferring the PCB stack to an inspection probe includes a movable support unit, a guide unit and a cover. The guide unit is provided on the support unit and defines a depression portion in which the PCB stack is mounted. The cover is configured to cover the depression portion of the guide unit when closed, where the cover has multiple protrusions extending from a lower surface, which press the PCB stack into the depression portion when the cover is closed.

Growing community of inventors

Seoul, South Korea

Chris Chung