Average Co-Inventor Count = 5.11
ph-index = 2
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Nova Measuring Instruments Ltd. (7 from 188 patents)
2. Kla-tencor Technologies Corporation (1 from 641 patents)
8 patents:
1. 12165863 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
2. 11764050 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
3. 11430647 - Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry
4. 10910208 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
5. 10636644 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
6. 10403489 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
7. 10056242 - Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
8. 7098456 - Method and apparatus for accurate e-beam metrology