Korea Institute of Science and Technology

Choong Hyun Kim

Hyo Sok Ahn

Andrei M Dubravin

Oleg Y Komkov

Sungmin Han

Inchan Youn

Song Joo Lee

Nikolai K Myshkin

Sergei A Chizhik

Hyo-Sok Ahn

Jinmyeong Lee

Doo In Kim

Disclosed is a gait start intention detection device for detecting a walker's gait start intention, including a plurality of left foot sole sensor units and a plurality of right foot sole sensor units to measure ground reaction force signals generated from foot soles while walking, and a calculation unit to receive and calculate the left ground reaction force signal and the right ground reaction force signal, wherein the calculation unit calculates a center of pressure (COP) location in a walking direction and a direction perpendicular to the walking direction using data of the ground reaction force signal measured from each sensor unit, and detects the walkers gait start intention when a ground reaction force of a swing foot heel of the walker increases, and at the same time, the COP location moves to a rear side of the walker.

Wearable gait start intention detection device

The training apparatus according to an embodiment includes: a support unit; a guide unit fixed on the support unit and including rails which extend in a front-rear direction; a sliding unit which is movable in the front-rear direction along the rails of the guide unit; a pillar-shaped rotation axis fixed on the support unit; a footrest unit which supports a user's foot; a lower support formed below the footrest unit; and a connection rotating unit formed below the footrest unit and connected to the rotation axis of the support unit through insertion to allow the footrest unit to rotate around the rotation axis. A plurality of springs installed inward from two sidewalls of the sliding unit is configured to come into contact with the lower support of the footrest unit and apply pressure from two sides when the footrest unit rotates.

Training apparatus for improving control ability of lower limb

A device and method for etching a wire to manufacture it into a tip for a scanning probe microscope or the like. The wire etching device generates a voltage signal for determining the level of a wire etching voltage, and applies the etching voltage of the level determined depending on the generated voltage signal to the wire to primarily etch it. The wire etching device measures the amount of etching current generated during the primary etching process and controls the level of the voltage signal according to the measured etching current amount so as to control the level of the etching voltage. Then, the device secondarily etches the wire with the level-controlled voltage signal. Therefore, the wire etching device can manufacture the tip while controlling its curvature radius and aspect ratio and reducing the amount of oxide on its surface. This has the effect of manufacturing the tip precisely according to a scanning purpose of an atomic force microscope or scanning tunneling microscope and a feature of a sample to be measured.

Wire etching device and method

A fine friction and wear test apparatus for a plate specimen comprises a fixing unit a driving unit installed on the fixing unit for fixing and moving a certain plate specimen, a ball specimen support member for rubbing and wearing the plate specimen, a rotation plate position controller fixed on the fixing unit for controlling the position of the ball specimen support member, a ball specimen controller for controlling the ball specimen support member, a controller for detecting the degree of a friction and wear of the plate specimen and controlling each mechanical and circuit part; and a power supply unit for supplying a power to a part which requires a certain power.

Fine friction and wear test apparatus for plate specimen

The present invention relates to a two-phase scanning method and apparatus for obtaining information necessary to analyze physical properties of materials using a scanning probe microscope. The scanning operation of the present invention is divided into two phases. First, in order to obtain information on a surface of a sample, a first scan is provided while the probe moves along the sample surface. Based upon results of the first scan, an imaginary line is defined on an average plane of the sample surface. Then, an imaginary plane, one side of which intersects the imaginary line and makes a predetermined angle with reference to the average plane, is defined over an area of interest on the sample surface. The probe is then positioned at a predetermined height on the imaginary inclined plane, and a second scan is provided during downward movement of the probe along the imaginary inclined plane.

Growing community of inventors

Seoul, South Korea

Choong Hyun Kim