Lg Display Co., Ltd.

Chongho Lee

Sungwon Kim

Dongwon Park

SungHoon Kim

An iDP interface test method includes transmitting test clocks to an iDP sink device; determining whether or not a link clock lock operation in the iDP sink device is successful based on a measurement result of an HPD signal when a clock lock operation for the test clocks is performed; transmitting test data and arbitrary video data to the iDP sink device if the link clock lock operation in the iDP sink device is successful; determining whether or not a symbol lock operation in the iDP sink device is successful when the symbol lock operation for the test data and the arbitrary video data is performed; and comparing a count result with a predetermined reference value, and determining link stability of the iDP sink device based on the comparison result.

Internal display port interface test method and device

A method for recovering pixel clocks based on an iDP interface includes selecting a prime factor closest to VA or HA from prime factors of X, and selecting a value obtained by subtracting VA from the selected prime factor, as VB, in where HA indicates a horizontal active period, HB indicates a horizontal blank interval, VA indicates a vertical active period, and VB indicates a vertical blank interval, fixing the selected VB value, and selecting a total of HB within one frame period and the number of lanes under a condition that Mvid has an integer value, and recovering pixel clocks by multiplying a frequency of link symbol clocks of data received via the lanes by a multiplication of Mvid/48.

Growing community of inventors

Paju-si, South Korea

Chongho Lee