Corning Incorporated

Chong Pyung An

Bruce Gardiner Aitken

Mark Alejandro Quesada

Philip Robert LeBlanc

Peter Knowles

Gabriel Pierce Agnello

Douglas Miles Noni, Jr

Correy Robert Ustanik

Richard Sean Priestley

James Patrick Trice

En Hong

Balamurugan Meenakshi Sundaram

Jamie Todd Westbrook

Zhenxing Hu

Bosun Jang

Ljerka Ukrainczyk

Garrett Andrew Piech

Yuhui Jin

Rohit Rai

Dale Alan Webb

Ryan Claude Andrews

Rajeshkannan Palanisamy

Uta-Barbara Goers

Benjamin Zain Hanson

Michal Mlejnek

Siva Venkatachalam

James Arthur Smith

Tian Huang

Johannes Moll

Galan Gregory Moore

Erika Lynn Stapleton

Piotr Janusz Wesolowski

Ji Hwa Jung

Sung-chan Hwang

Tae-ho Keem

Sung-jong Pyo

William Kenneth Denson

Sang-Mook Lee

Hyeong-cheol Lee

Amanda Kathryn Thomas

David Bruce Moorehouse

Denwood Falconer Ross, Iii

A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

Apparatus and method for inspecting laser defect inside of transparent material

An apparatus for testing a sheet of brittle material is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.

Apparatus and method for testing edge strength of sheet of material having detection mechanism for optically measuring strain in sheet

An apparatus for testing the edge strength of a discrete sheet of material such as glass where the sheet has an irregular free-form shaped outline is disclosed. The apparatus can include a plurality of assemblies configured for selectively applying a 3-point bending load on an edge of the sheet of material in a test region of the apparatus, a detection mechanism that optically measures strain in the sheet of material in the region, and a processor that determines the stress in the sheet based on the measured strain by calculating the stress that would be required to produce the measured strain in the sheet of material.

Edge strength testing of free-form glass panel

A method for determining crystal phases of a glass ceramic sample, including the steps of applying energy to the sample using an excitation source, detecting raw Raman spectral energy that is given off by the sample using a detector, wherein the raw Raman spectral energy includes peak values, determining a plurality of predetermined energy peaks based off a composition of the sample, superimposing the plurality of predetermined energy peaks over the raw Raman spectral energy, applying a baseline value between each predetermined energy peak, subtracting the baseline value from the raw Raman spectral energy, calculating corrected peak values based on the raw Raman spectral energy and baseline value, and determining the crystal phases of the glass ceramic sample based on the corrected peak values.

Method of phase quality control for glass ceramics in manufacturing

A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Method and apparatus for inspecting defects on transparent substrate and method emitting incident light

Apparatus and method for testing a sheet of brittle material comprising the steps of measuring one or more edge features of a sheet of brittle material, imparting a bend to the sheet of brittle material and producing relative motion between the sheet and the bend such that the bend traverses the sheet. A stress can be induced in the sheet as a function of the relative motion and imparted bend, wherein the induced stress corresponds to a predetermined strength value, and the measured one or more edge features can be correlated with the strength value.

Edge strength testing methods and apparatuses

A method includes introducing light into a glass article such that at least a portion of the introduced light is emitted from an edge of the glass article. The light emitted from an edge of the glass article is detected. An intensity profile of the emitted light is an intensity of the emitted light as a function of axial position. A first intensity boundary of the intensity profile and a second intensity boundary of the intensity profile are determined. A thickness of a layer of the glass article is determined based on an axial distance between the first intensity boundary and the second intensity boundary.

Method and system for measuring thickness of glass article

A sealing method for decreasing the time it takes to hermetically seal a device and the resulting hermetically sealed device (e.g., a hermetically sealed OLED device) are described herein. The sealing method includes the steps of: (1) cooling an un-encapsulated device; (2) depositing a sealing material over at least a portion of the cooled device to form an encapsulated device; and (3) heat treating the encapsulated device to form a hermetically sealed device. In one embodiment, the sealing material is a low liquidus temperature inorganic (LLT) material such as, for example, tin-fluorophosphate glass, tungsten-doped tin fluorophosphate glass, chalcogenide glass, tellurite glass, borate glass and phosphate glass. In another embodiment, the sealing material is a Sn-containing inorganic oxide material such as, for example, SnO, SnO+POand SnO+BPO.

Sealing technique for decreasing the time it takes to hermetically seal a device and the resulting hermetically sealed device

Disclosed are systems and methods for determining the shape of a glass sheet during and/or after the forming process. In one example, a system for determining the shape of a glass sheet defining an interior bulk can include a light source, an image capture device and a processor that are configured to calculate the location of an energy centroid within a selected portion of the bulk of the glass sheet.

Systems and methods for determining the shape of glass sheets

A method is disclosed for inhibiting oxygen and moisture penetration of a device comprising the steps of depositing a tin phosphate low liquidus temperature (LLT) inorganic material on at least a portion of the device to create a deposited tin phosphate LLT material, and heat treating the deposited LLT material in a substantially oxygen and moisture free environment to form a hermetic seal; wherein the step of depositing the LLT material comprises the use of a resistive heating element comprising tungsten. An organic electronic device is also disclosed comprising a substrate plate, at least one electronic or optoelectronic layer, and a tin phosphate LLT barrier layer, wherein the electronic or optoelectronic layer is hermetically sealed between the tin phosphate LLT barrier layer and the substrate plate. An apparatus is also disclosed having at least a portion thereof sealed with a tin phosphate LLT barrier layer.

Tin phosphate barrier film, method, and apparatus

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Painted Post, NY, United States of America

Chong Pyung An