Intel Corporation

Apple Inc.

Cho-Ying Lu

Ashoke Ravi

William Li

Binta M Patel

Khoa Nguyen

Maneesha Yellepeddi

Hyung-Jin Lee

Telesphor Kamgaing

Georgios C Dogiamis

Henning Braunisch

Richard J Dischler

Matthias Eberlein

Jad Rizk

Chun Lee

Carlos Nieva-Lozano

Peter Tsugio Kurahashi

Triveni Suryakant Rane

An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

Time-interleaved analog-to-digital converter with calibration

There is disclosed in one example a communication apparatus, including: an analog data source; a digital communication interface; and an analog-to-digital converter (ADC) circuit assembly, including: an analog sample input; an input clock to provide frequency f; a time-interleaved front end to interleave n samples of the analog sample input; and an ADC array including n successive-approximation register (SAR) ADCs, the SAR ADCs including self-clocked comparators and configured to operate at a frequency no less than 

High-speed analog-to-digital converter

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Systems and methods for frequency domain calibration and characterization

Embodiments herein may relate to an interconnect that includes a transceiver, where the transceiver is configured to receive a data stream, convert the data stream to a quadrature amplitude modulation (QAM) mapping/shaping signal, where the QAM mapping/shaping signal is a frequency component of the data stream, convert the QAM mapping/shaping signal to a Hilbert transform signal, where the Hilbert transform signal includes a reverse order of an in-phase component of the QAM mapping/shaping signal and a reverse order of a quadrature component of the QAM mapping/shaping signal, convert the Hilbert transform signal to a QAM mapping/shaping signal, where the QAM mapping/shaping signal is a single sideband (SSB) time domain mm wave signal, where the SSB time domain mm wave signal is the Hilbert transform signal converted to a time domain signal, and communicate the SSB time domain mm wave signal over a waveguide using a waveguide interconnect.

Orthogonal frequency division multiplexing single sideband transmission over a waveguide

An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code.

Apparatus and method for single temperature subthreshold factor trimming for hybrid thermal sensor

Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.

Methods and apparatuses for determining a parameter of a die

Embodiments of a calibration circuit for a current source which may include a first control switch, a second control switch, and a capacitor. In embodiments, the first control switch may be operable to couple the capacitor to the current source and the second control switch may be operable to couple the capacitor to a reference current source to enable the capacitor to be charged or discharged according to a first control signal provided to the first control switch and a second control signal provided to the second control switch. In embodiments, the calibration circuit may be included in a digital-to-analog (DAC) converter.

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Hillsboro, OR, United States of America

Cho-Ying Lu