Ememory Technology Inc.

Chiun-Chi Shen

Chen-Hao Po

Yu-Hsiung Tsai

Hsin-Ming Chen

Shao-Chang Huang

Po-Hao Huang

Chien-Hung Ho

Chun-Hung Lu

Jie-Hau Huang

Chih-Bin Kuo

A voltage switch circuit uses PMOS transistors to withstand high voltage stress. Consequently, the NMOS transistors are not subject to high voltage stress. The lightly-doped PMOS transistors are compatible with a logic circuit manufacturing process. Consequently, the voltage switch circuit may be produced by a logic circuit manufacturing process.

Voltage switch circuit

The present invention provides a memory architecture and associated serial direct access (SDA) circuit. The memory architecture includes a memory of a parallel interface and a serial direct access (SDA) circuit. The SDA circuit includes an enable pin, a serial pin and an auto-test module. The enable pin receives an enable bit, wherein the SDA circuit is selectively enabled and disabled in response to the enable bit. When the SDA circuit is enabled, the serial pin sequentially relaying a plurality of serial bits, such that each of the serial bits is associated with one of parallel pins of the parallel interface; in addition, the auto-test module can perform a built-in test of the memory associated with the serial bits.

Memory architecture and associated serial direct access circuit

Voltage switch circuit produced by logic circuit manufacturing process capable of withstanding high voltage stress

A flash memory device with auto-trimming functionality includes a memory cell array comprising first memory cells and a fuse sector, a read circuit for reading a memory state of the first memory cells, an offset circuit for outputting offset current values, and an auto-trimming circuit. The auto-trimming circuit has a register for storing a current characteristic, a current control module for modifying input current applied to a first memory cell under test at a first address according to the memory state, and updating the current characteristic to the modified input current, an address counter for starting application of the modified input current to a second memory cell at a second address for test when reading the first memory cell passes, and a programming circuit for programming the fuse sector according to the current characteristic and the offset current values.

Method of setting trim codes for a flash memory and related device

When an electrostatic discharge event occurs to a connection pad of a chip, an electrostatic discharge detector layout in a feedback loop is able to detect an induced electrostatic discharge voltage for generating a control signal. A pass transistor can be turned off by the control signal for isolating the induced electrostatic discharge voltage, and the internal circuit of the chip can be protected from being damaged by the induced electrostatic discharge voltage. Furthermore, the designed circuit based on electrostatic discharge isolation technique for protecting the internal circuit of the chip is compatible with programmable circuits, and the connection pad can be furnished with burning signals or logic signals.

ESD avoiding circuits based on the ESD detectors in a feedback loop

A memory unit with sensing current stabilization includes: a memory cell; a reference cell for providing a reference current; a current mirror coupled to the memory cell and the reference cell for generating a differential current according to the reference current and a cell current of the memory cell; and a sense amplifier coupled to the current mirror for generating an output voltage according to the differential current.

Growing community of inventors

Hsinchu County, Taiwan

Chiun-Chi Shen