Sae Magnetics (h.k.) Limited

Tdk Corporation

Sae Magnetic (h.k.), Ltd.

Chiuming Lueng

Juren Ding

Rongkwang Ni

Cheukwing Leung

Mankit Lee

Cheukman Lui

Hokei Lam

Wanyin Kwan

Yasutoshi Fujita

Lorest Garcia Pingul

Siuman Mok

Kwokkam Leung

Chiyuen Mok

Kazuki Sato

Yohei Koyanagi

Wahchun Chan

Kaichiu Cheung

A manufacturing method of a slider includes steps of: (a) providing a row bar with a plurality of slider elements connecting together; (b) lapping surfaces of the row bar so as to obtain a predetermined requirement; (c) lowering the temperature of the surfaces lapped in the step (b) before and/or during lapping; and (d) cutting the row bar into a plurality of sliders. The present invention can prevent a local high temperature generated on the magnetic head during lapping so that the performance of the magnetic head is improved.

Manufacturing method of a slider

A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.

Method of testing anti-high temperature performance of a magnetic head and apparatus thereof

A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.

A reader sensor comprises a first shielding layer, a second shielding layer, a read element formed therebetween, and a pair of permanent magnet layer respectively placed on two sides of the read element; and it further comprises a magnetic field generating means formed beside the read element and arranged for providing a magnetic field with a direction perpendicular to the first shielding layer and the second shielding layer, thereby stabilizing the reading performance of the reader sensor. The invention can stabilize the reading performance, ameliorate the unstable defective reader sensor, and decrease the waste and the manufacturing cost. The present invention also discloses a magnetic head, a HGA and a disk drive unit.

Reader sensor, magnetic head, head gimbal assembly and disk drive unit with the same

A manufacturing method of a slider includes steps of (a) providing a row bar with a plurality of slider elements connecting together, the row bar having an air bearing surface, a back surface opposite the air bearing surface, a bonding surface and a bottom surface opposite the bonding surface; (b) grinding the bottom surface of the row bar; (c) lapping the air bearing surface of the row bar so as to obtain a predetermined requirement, and applying a first magnetic field with a first direction during lapping the air bearing surface, and the first direction being parallel to the air bearing surface and the bonding surface; and (d) cutting the row bar into a plurality of individual sliders. The present invention can maintain a good performance of a magnetic head during the manufacturing process.

Manufacturing method of a slider and manufacturing apparatus thereof

A spectral simulation method during a noise testing for a magnetic head, includes steps of (a1) detecting several first noise profiles for several magnetic head samples under a first frequency bandwidth range by a dynamic testing machine; (b1) separating each first noise profile into at least two noise curves including a first noise curve and a second noise curve at a predetermined frequency bandwidth, wherein the first noise curve has a frequency bandwidth range lower than that of the second noise curve; (c1) fitting several mathematical equations according to the second noise curves; and (d1) establishing a correlative equation among the mathematical equations, so as to simulate the second noise curve for each magnetic head. The present invention can simulate a second noise curve of the noise profile in a higher frequency bandwidth and establishing the correlative equation according to the second noise curve.

Spectral simulation method during noise testing for a magnetic head, and noise-testing method for a magnetic head by using the same

A method for measuring longitudinal bias magnetic field in a tunnel magnetoresistive sensor of a magnetic head, the method includes the steps of: applying an external longitudinal time-changing magnetic field onto the tunnel magnetoresistive sensor; determining a shield saturation value of the tunnel magnetoresistive sensor under the application of the external longitudinal time-changing magnetic field; applying an external transverse time-changing magnetic field and an external longitudinal DC magnetic field onto the tunnel magnetoresistive sensor; determining a plurality of different output amplitudes under the application of the external transverse time-changing magnetic field and the application of different field strength values of the external longitudinal DC magnetic field; plotting a graph according to the different output amplitudes and the different field strength values; and determining the strength of the longitudinal bias magnetic field according to the graph and the shield saturation value.

Method for measuring longitudinal bias magnetic field in a tunnel magnetoresistive sensor

A close loop method for measuring head SNR, for a storage device comprising a storage media and a head, comprising steps of: (a) loading the head on the media with a dynamic fly height; (b) measuring an initial environmental temperature value T1 and measuring the head signal signal; (c) unloading the head; (d) adjusting a power which controls the dynamic fly height until a real-time environmental temperature value T2 is equal to the initial environmental temperature T1; (e) measuring the head noise value noise, (f) calculating the head SNR with the follow equation: The method of the present invention can obtain a fair condition between the signal and noise measurement, thereby a reliable and accurate head SNR can be obtain. The present invention also provides a close loop method for measuring media SNR.

Close loop method for measuring head SNR and media SNR

A method for measuring a temperature rise induced by bias current/bias voltage in a magnetic tunnel junction includes: (a) applying an external time-changing magnetic field to the magnetic tunnel junction; (b) measuring different first outer pin flip field values under different temperature values; (c) correlating the temperature values with the outer pin flip field values; (d) measuring different second outer pin flip field values under different bias current/bias voltage values; (e) correlating the different bias current/bias voltage-values with the measured different second outer pin flip field values; and (f) correlating temperature values and bias current/bias voltage values according to the results produced by (c) and (e). The method can determine what kind of TMR reader design provides more stable and reliable reading performance, especially under higher operational temperatures.

Method for measuring the temperature rise induced by bias current/bias voltage in a magnetic tunnel junction

A MR sensor comprises a first shielding layer, a second shielding layer, a MR element and a pair of hard magnet layers sandwiched therebetween, and a non-magnetic insulating layer formed at a side of the MR element far from an air bearing surface of a slider. The MR sensor further comprises a first non-magnetic conducting layer formed between the first shielding layer and the MR element, and the first non-magnetic conducting layer is embedded in the first shielding layer and kept separate from the ABS. The MR sensor of the invention can obtain a narrower read gap to increase the resolution power and improve the reading performance, and obtain a strong longitudinal bias field to stabilize the MR sensor so as to increase the total sensor area and, in turn, get an improved reliability and performance. The present invention also discloses a magnetic head, a HGA and a disk drive unit.

Magnetoresistive sensor, including non-magnetic conducting layer embedded in shielding layer and magnetic head, head gimbal assembly and disk drive unit with the same

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Hong Kong, China

Chiuming Lueng