Globalfoundries Singapore Pte. Ltd.

Chiu Wing Hui

Ushasree Katakamsetty

Shyue Fong Quek

Vito Dai

Edward Kah Ching Teoh

Valerio Perez

Beng Lye Oh

Wee Kwong Yeo

Yeow Loye Siew

Yang Qing

System and methods for design-for-manufacturing and design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow are presented. A method includes receiving design data related to layout of an integrated circuit (IC); extracting information from the design data; and performing analysis on the extracted information. The method also enables DFM-DEM aware manufacturing applications using information stored in a knowledge database. The method further updates the knowledge database with new information learned from at least the extracted information and the analysis.

Design-for-manufacturing&#x2014;design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow

Enhancements in lithography for forming an integrated circuit are disclosed. The enhancements include a topography analysis of a design data file to obtain accumulative topography information for different mask levels. The topography information facilitates topography driven optical proximity correction and topography driven lithography.

Topography driven OPC and lithography flow

A method for selecting and placing of an IP block in a SOC design based on a topology and/or a density of the SOC design is disclosed. Embodiments include: displaying a user interface; causing, at least in part, a presentation in the user interface of a topology and density view of a SOC design that includes an IP block; and modifying, prior to a tape-out of the SOC design, topology and/or density transition for the IP block in the SOC design based on the presentation.

Topology density aware flow (TDAF)

Growing community of inventors

Singapore, Singapore

Chiu Wing Hui