Stmicroelectronics International N.v.

Stmicroelectronics S.a.

Stmicroelectronics (crolles 2) Sas

Stmicroelectronics Pvt. Ltd.

Stmicroelectronics (alps) Sas

Chittoor Parthasarathy

Kallol Chatterjee

Nitin Chawla

Vincent Huard

Abhishek Jain

Pascal Urard

Promod Kumar

Mickael Denais

SaurabhKumar Singh

Silvia Brini

A method for determining a margin of use of an integrated circuit includes monitoring at least one sensor so as to determine at least one physical parameter representative of use of the integrated circuit, evaluating the at least one physical parameter to determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter, and calculating the margin of use for the integrated circuit from a comparison of the instantaneous state of aging with a presumed state of aging. If operation of the integrated circuit is outside the margin of use, at least one operating performance point of the integrated circuit is adjusted so as to bring operation of the integrated circuit back within the margin of use.

Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chip

A system on a chip includes at least one integrated circuit that is configured to operate at least at one operating point. A monitoring circuit acquires at least the cumulative duration of activity of the at least one integrated circuit. An evaluation circuit establish at least one instantaneous state of aging of the at least one integrated circuit based on the at least one cumulative duration of activity. An adjustment circuit operates to change the at least one operating point on the basis of the at least one state of aging of the at least one integrated circuit.

Method for adjusting at least one operating point of at least one integrated circuit of a system on a chip, and corresponding system on a chip

A system-on-a-chip includes an integrated circuit and an estimation circuit. The estimation circuit operates to acquire at least one physical parameter representative of the use of the integrated circuit and determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter. A margin of use of the integrated circuit is then calculated by comparing the instantaneous state of aging with a presumed state of aging.

An embodiment of a circuit includes a data latch and a plurality of cascaded latches, wherein a first of the plurality of cascaded latches is configured to receive a first signal from the data latch and each subsequent cascaded latch is configured to receive a data output signal of a preceding cascaded latch, and an error-detection circuit configured to receive the respective data output signals and detect error in operation of the cascaded latches based thereon.

Apparatus for monitoring operating conditions of a logic circuit to determine failure of one or more latches

An embodiment of a detector includes first and second generators. The first generator is operable to receive a transition of a first signal and to generate in response to the transition a first pulse having a length that is approximately equal to a length of a detection window. And the second generator is operable to receive a second signal and to generate a second pulse having a relationship to the first pulse in response to a transition of the second signal occurring approximately during the detection window.

Transition detector

Disclosed is a system and method for providing a critical path replica system in a circuit. A critical path replica system is created by determining a critical path in a circuit, generating a critical path replica circuit, generating a circuit blueprint, and creating the blueprinted circuit. The circuit comprises a functional logic module having functional logic elements and replica logic modules having logic elements. Each logic element is configured to replicate one or more of the functional logic elements and process a test signal. A replica error detection module analyzes the processed signal to determine whether a timing violation has occurred. In some embodiments, the replica logic module further comprises one or more load modules. A replica controller may modify operation of the circuit based on reported errors. A replica mode select module sets the replica logic module to an aging test mode or a timing sensor mode.

System and method for critical path replication

An arrangement including at least one path, at least one replica path, the at least one replica path corresponding to a respective path, a controller configured to use control information derived from the at least one replica path, at least one of the paths comprising a monitoring unit configured to provide monitor information to the controller, the controller being configured to modify the control information in dependence on the monitor information.

Calibration arrangement

Adaptive scaling digital techniques attempt to place the system close to the timing failure so as to maximize energy efficiency. Rapid recovery from potential failures is usually by slowing the system clock and/or providing razor solutions (instruction replay.) These techniques compromise the throughput. This application presents a technique to provide local in-situ fault resilience based on dynamic slack borrowing. This technique is non-intrusive (needs no architecture modification) and has minimal impact on throughput.

Adaptive multi-stage slack borrowing for high performance error resilient computing

Apparatus for monitoring operating conditions of a logic circuit

An integrated circuit comprising at least one MOS-type transistor, further comprising a system for detecting the variations of the electrical quantities of the at least one transistor, and a biasing device modifying the bias voltage of the bulk of the at least one transistor according to the variations measured by the detection system.

Compensation for electric drifts of MOS transistors

Adaptive scaling digital techniques attempt to place the system close to the timing failure so as to maximize energy efficiency. Rapid recovery from potential failures is usually by slowing the system clock and/or providing razor solutions (instruction replay.) These techniques compromise the throughput. We present a technique to provide local in-situ fault resilience based on dynamic slack borrowing. This technique is non-intrusive (needs no architecture modification) and has minimal impact on throughput.

A system on chip (SoC) has a digital domain. An adaptive voltage/frequency scaling circuit includes a critical path replica circuit with respect to that digital domain. The critical path replica circuit generates a margin signal, and the adaptive voltage scaling circuit responds to the margin signal by decreasing bias voltage (and/or increasing clock frequency) applied to the digital domain of the system on chip so as to recover available margin. A fail-safe timing sensor is included within the digital domain of the system on chip. The timing sensor generates a flag signal when timing criteria within the digital domain are violated. The adaptive voltage scaling circuit responds to the flag signal by increasing the bias voltage (and/or decreasing the clock frequency) applied to the digital domain of the system on chip so as to implement a recovery operation.

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Greater Noida, India

Chittoor Parthasarathy